Ingegneria Elettronica (Electronic Engineering)

• Knowledge of the various types of mixers and amplifier stages and their applications; ability to analyze and design the related circuits, carrying out device selection and evaluating the various design choices. - Ability to analyse and design amplifiers and other circuits based on Operational Amplifiers; knowledge and application of parameters and selection criteria for integrate Op Amps and other integrated complex functional units. - Quantitative evaluation of effects of sampling and quantization in Analog to Digital conversion; design of A/D systems with error budget allocation. Knowledge of parameters and circuits for A/D and D/A converters. Ability to select active and passive device, and to integrate them in a complex design. Knowledge of differential converters, with evaluation of oversampling and noise shaping effects. - Knowledge of radio systems architecture for receivers and transmitters, including ZIF digital architectures and SW radio (SDR). Operation, parameters and basic circuit for radio systems units. Ability to define the characteristics and to design some of these functional units. - Knowledge of behaviour, models, and applications of Phase Lock Loops (PLLs); ability to analyze a PLL systems, select integrated devices and design circuits for PLLs functional units and for simple PLL-based applications.

The course is taught in English. This is a mandatory course (in some curricula it can be replaced by “Elettronica Analogica e di Potenza�, in Italian) for the Master Degree in Electronics. The course aim is to review and study in depth various subjects of Analog Electronics, with an emphasis on contents related with telecommunication applications. The most relevant issues related with analog and telecommunication subsystems are analysed in detail, to establish a reference point for the following courses, which addresses more specific subjects.

Radio systems. Heterodyne receivers and transmitters, ZIF (2 CFU) - Basic architectures for receiving and transmitting radio systems; heterodyne architecture - Image signals, I/Q mixer, image rejection techniques; - Digital radio systems, SDR ; - Basic modules : LNA, PA, mixer, oscillators; intermodulation and IPs. Review of amplifier stages, amplifier and filter circuits, (including SC); operating limits (2.5 CFU) - basic amplifier stages; nonlinearity, distortion, harmonics, gain compression - tuned amplifier, large signal analysis - sine signal generators - review of time-continuos filters - basic SC circuits; parameters and nonidealities, - amplifiers and filters with SC circuits. Phase lock loops (PLL) (2 CFU) - PLL linear analysis. Loop filter, phase error, capture and lock ranges - Phase detector and VCO circuits - PPL synthesizers and direct digital synthesizers (DDS) - Examples of integrated PLL and ADPLL - Applications for synchronous demodulation of analog and digital signals, and clock re-synchronization. A/D/A conversion, parameters, errors, ADC and DAC circuits (2.5 CFU) - Review of analog and digital signal parameters, sampling, aliasing, SNRq; - Parameters and errors in DAC and ADC, taxonomy based on complexity and speed; residue and pipeline circuits. - Differential converters (delta and sigma-delta), oversampling and noise shaping; decimation and interpolation filters; - Nonlinear converters, logarithmic circuits, voice signal encoding techniques; - Signal conditioning, anti-aliasing filters, errors in multiplexers and S/H circuits; definition and evaluation of ENOB. Power devices (1 CFU) - MOS and BJT devices, SOA - Driving ON/OFF loads

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria; Prova pratica di laboratorio;
Exam: Written test; Compulsory oral exam; Practical lab skills test;
... The final assessment includes a written test and an oral discussion. The written test consists of 2-3 numerical design exercises, related with the main subjects addressed in the course (analog circuits, A/D/A conversion systems and circuits, radio systems and PLLs,). Each exercise may have 4-6 questions; to pass the exam, one must deliver correct answer for at least the first two questions of each problem. The total time for the written test is 1,5 hours. The oral discussion lasts around 20-30’, and concerns all the subjects addressed in the lessons plus a short verification of the student capabilities in working in a electronic lab. The final mark is a weighted average of written test and oral discussion plus lab reports evaluation (0-2 points). The mark can be improved by developing mini-projects (agreed with the professor), or by preparing good notes from the lectures (to be used in the following years).

A textbook is in preparation and will be possibly ready for the course start. If not draft versions of the book chapters will be made available. A textbook which includes most of the addressed subject is: Design with Operational Amplifiers and Analog Integrated Circuits (III Edition), McGraw-Hill, 2002. Radio systems and PLLs are however described in: D. Del Corso, Elettronica per Telecomunicazioni, McGraw-Hill, 2000 (in Italian, available as print-on-demand in the publisher’s website). Copies of slides used in the lectures, examples of written tests, instruction manuals for the lab are available from the course website.

• Knowledge of several processor architectures, with particular attention paid to x86, ARM and MIPS families - Superscalar and multithread architectures - Knowledge of the sw/hw architecture of an embedded system - Knowledge about system bus, cpu and I/O characteristics - Competences about I/O management and interface design - Competences about development of applications for embedded systems - Assembly code implementation for I/O device management.

The course is taught in English. Mandatory course for Laurea Magistrale in Computer Science Engineering, in the first year and first semester of the course. The purpose of the course is to provide a better knowledge on the elaboration system architecture, with a particular attention to microprocessor based systems. The course analyzes the several components of an elaboration system: from the microprocessor internal architecture, up to system bus for peripheral devices management.

• Advanced description of the basic microprocessor architecture • Introduction to modern microprocessor architectures • CISC, RISC and superscalar processor architectures, behavior and performance • Microprocessor-based systems architecture • Development flow of embedded system applications using a development board • Advanced programming techniques for embedded systems: theory and practice • Advanced assembly programming techniques (ARM, 8086): theory and practice.

Modalita di esame: Test informatizzato in laboratorio; Prova orale facoltativa; Elaborato progettuale individuale;
Exam: Computer lab-based test; Optional oral exam; Individual project;
... The exam consists of a written plus a (mandatory) oral part. The written part is further divided into two sub-parts: 1. The first sub-part consists of open&closed questions about subjects covered during lectures. While this sub-part is being run, it is not possible to use any book or other material. Max score = 8 points; minimum score to have this first sub-part passed = 4 points. 2. The second sub-part consists of the development of an assembly program. While this sub-part is being run, it is possible to use only printed books and/or documents in electronic format downloaded from the web site of the course (Portale della Didattica). Maximum score = 18 points; minimum score to have this second sub-part passed = 10 points. The written part (=first+second sub-parts) lasts from 2 to 3 hours and has to be passed in both its two sub-parts. Failing one of the two sub-parts will imply a rejection. The correction of the written tests takes place during the oral part; the presence of the student is required, otherwise his/her vote will be rejected / refused. Points in the two parts are added up. At the end of the correction, the student will be able to continue the oral exam, consisting of at most three additional questions adding up to 8 more points. The first oral question (max 3 points) will be, by definition, always on laboratory exercises, while the other two will cover in full the course's program. Failure to satisfactorily responding a question, will imply a negative score for that question and the possible termination of the oral exam. If less than 18 points are obtained, a rejection will be registered. Professor(s) has (have) the right to ask at any time oral questions to get a better and more complete picture of the student's preparation. The final grade will be determined by adding up all the points collected by the student and rounding the numerical result. Laude will be granted to all students whose number of points exceeds 31.5 (before rounding). Overall, the exam is targeted at evaluating the students both from their abilities to design, write and run assembly programs, and their knowledge of modern computing systems architectures.

• J.L. Hennessy, D.A. Patterson, Computer Architecture: a Quantitative Approach, Morgan Kaufmann Publishers, Inc., VI Edition, 2017 • Steve Furber, ARM system-on-chip architecture, Addison-Wesley, 2000. Optional additional material provided by the Lecturers.

Knowledge of basic elements of information theory. Ability to analyze the performance of a telecommunication system with AWGN channel and narrow band channel. Knowledge of the intersymbol interference (ISI) problem and use of eye diagrams. Knowledge of the main characteristics of passband digital modulation. Knowledge of the main multiple access channel. Knowledge of the main blocks of a CDMA receiver: multibit A/D conversion, adaptive gain control (AGC) and quantization.

The course is taught in English. The course objective is to describe the main characteristics of telecommunication systems, with emphasis to wireless systems. During the course digital transmission techniques are presented in order to analyze in detail some of the specific characteristics of the signal processing needed in receiver front end. The main multiple access methods will be described together with examples from real systems, such as Code Division Multiple Access (CDMA).

Part I – Introduction and modelling of information sources and source coding (6 hours) Part II – Pulse Amplitude Modulation over AWGN channel (22 hours) • Digital transmission through AWGN channel (Pulse modulation and geometric representation - Matched filter demodulator - Probability of error in AWGN) • Digital PAM transmission through bandlimited AWGN channel, ISI and eye diagram Part III – Digital transmission via carrier modulation (16 hours) • Digital transmission via carrier modulation (Carrier-phase modulation, constant envelope) • Digital transmission via carrier modulation (Quadrature Amplitude modulation) Part IV – Channel Access Methods and receiver RF front end (16 hours) • Definition of principal channel access methods (TDMA, FDMA and CDMA) • A practical example of CDMA: the Global Navigation Satellite Systems • Basics of RF signal conditioning: AD conversion and quantization • The role of the Automatic Gain Control in multibit quantization • Interfering signals

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... Written exam on course’s topics (both theory and exercises). Duration: from 60 to 120 minutes.

Teacher’s material, available on the course web portal. Textbook: J. G. Proakis, M. Salehi, Communication Systems Engineering, Prentice Hall; 2nd edition (2001); Language: English; ISBN-10: 0130617938; ISBN-13: 978-0130617934

• Knowledge of the general structure of a digital processing system: processing element, memory. I/O, interconnection network and timing. • Knowledge of the main characteristics of general purpose microprocessors: internal structure, taxonomy, programming model. • Ability to integrate additional functions into a processing unit and to interface a coprocessor to a general purpose processor. • Knowledge of existing memory types. Taxonomy, access protocols, physical models, interfacing and choice according to cost, area and performance parameters. • Knowledge of memory hierarchy in a processing system: cache and virtual memory. • Knowledge of the main peripheral devices: Digital and analog I/O, synchronous and asynchronous communication systems. Buffering strategies and clocking schemes, interfacing and implementation methodologies. • Ability to integrate custom peripherals into existing processing units. • Knowledge of the use of programmable logic components (PLD, FPGA) in embedded systems: design flow, area and speed optimization. • Knowledge of interconnection technologies at the physical level: technologies, transmission lines, crosstalk, basics of electromagnetic compatibility. • Knowledge of interconnection technologies at the logical level: topologies, addressing, error handling, examples of standards. • Knowledge of the techniques for the generation and distribution of timing signals. • Knowledge of the techniques for analyzing specification and constraints in complex digital systems. • Ability to understand specifications and requirement in the design of complex digital systems. Analysis of algorithmic choices (based on computational complexity, interconnection bandwidth, data representation both format and bit-width). • Knowledge of standard techniques to design control units in complex digital systems. • Knowledge of standard techniques to design an execution unit either in parallel or sequential form.

The course is taught in English. The course is compulsory (in alternative with Sistemi Digitali Integrati) for the Master Program and is at the 1st semester of the 1st year. The goal is to provide a deep insight into design methodologies of complex digital systems. This task requires a clear view of the possible design choices and the ability to integrate different components. The course will analyze systems composed of microprocessors/microcontrollers, programmable logic, memories and interfaces to the external world. Special emphasis will be given to how to interface, program, interconnect digital blocks and to the "design flow", namely to design tools and methodologies.

The course may be approximately divided into 4 main parts: 1. Computer architectures for embedded systems (3 CFU) a. Microprocessor Architecture b. Peripheral interfacing, DMA and interrupts c. Programmable devices 2. Memory structures (3 CFU) a. Memory technology b. Volatile and non-volatile memory structures c. Cache memories 3. Interconnection and interfacing structures (2 CFU) a. Signal propagation, delay and skew b. Synchronous and asynchronous transfer cycles c. Transactions, Arbitration and Addressing d. Parallel communication structures, bus e. Serial communication structures. Peripheral buses 4. Integrated processing systems (2 CFU) a. Specification and requirements analysis b. Timing analysis in complex digital systems c. Control units and execution units

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria; Prova pratica di laboratorio; Prova scritta in aula tramite PC con l'utilizzo della piattaforma di ateneo;
Exam: Written test; Compulsory oral exam; Practical lab skills test; Computer-based written test in class using POLITO platform;
... The verification of the learning will take place through the laboratory work evaluation (optional, but strongly recommended), a written exam (mandatory) and an oral exam (mandatory). The written exam has a duration of approximately 2 hours and is composed of 2 design-based exercises. Books, notes or any other kind of material is not allowed during the exam. The written exam aims to verify design skills acquired by students during the course, in particular the ones related to the structure of digital processing systems, including the ability to design/integrate specific functions into a processing unit and to understand specification and constraints in the design of digital systems. The written exam verifies also the knowledge of the main peripheral devices in a computing system and to use standard techniques to design the different part of a digital system. Each exercise requires the student to detail different steps of the design methodology used to solve the exercise. Students are allowed to take the oral exam if the written exam is rated at least as “sufficient�. The oral exam is made of questions on the theoretical or the descriptive parts of the course as well as on laboratory-related aspects and aims to verify the understanding of these parts of the course. The total exam score is a weighted average of the written (50%) and oral (50%) exam scores, plus the laboratory score and can lead to a maximum score equal to 30 cum laude. Special projects are available for strongly motivated students. A special project leads to at most a +3 to the final score.

The book "Embedded system design" di F. Vahid covers approximately 30% of the course. Slides of the course together with manuals and datasheets of the components analyzed during classes are available. Moreover, all laboratory assignments and material are available as well. All the material is available on "Portale della Didattica".

• Knowledge of various types of amplifier stages and their applications; analysis and circuit design capabilities, with selection of components to evaluate the effects of various design choices. • Knowledge of existing memory types: type, access methods, physical model, interfaces, hierarchy; ability to choose based on cost / area / performance. • Knowledge of the architecture of high performance PLDs and FPGAs: internal architecture, design flow, optimizations for power consumption, size, speed. • Capacity to design digital operational units, to describe them in VHDL language, to simulate the behaviour and to implement them according to specifications (synthesis on programmable device, high-level programming on microprocessors, ...). • Knowledge of the structure of the main peripherals used: digital I/O, buffering strategies, timing systems, synchronous and asynchronous communication systems; ability to choose appropriate methodologies for implementation and interfacing. • Capacity to define the necessary blocks in an embedded system starting from a specification and to define the design constraints (microprocessor/microcontroller, memories, programmable devices, power systems, conversion systems, peripherals, bus) and their interfacing. • Knowledge of issues relating to interconnections: technologies, synchronous and asynchronous protocols, performance evaluation. • Knowledge of various types of A/D and D/A converters, their characteristics and associated circuits; ability to choose analog integrated components and design of the required circuits for their use and interfacing. • Knowledge of the characteristics of different types of voltage regulators, switching and dissipative, and criteria for selection of active and passive components; ability to design low power regulators.

Required course for the Embedded System curriculum, jointly held between Electronics Engineering and Computer Science master degree programs, in the first didactic period of the first academic year. The course aims to describe and test the major digital and analog blocks on a board and to identify key issues relating to their communication. In particular, it describes the main micro-architectural structures for the processing, control and storage of data and will make a practical description in the laboratory. Problems related to communication between blocks on the board (use of interfaces for complex communications systems, communication standards, etc…) are analysed and experimented in the laboratory. It outlines issues and will explore the use of different complex programmable and embedded systems on boards based on microprocessor or microcontrollers, FPGAs and current peripheral devices.

1) Embedded systems (0,5 CFU) a) Definition, classification and examples b) Design metrics (costs, performance, time to market) c) Anatomy of an embedded system and summary of course topics 2) Operational amplifier with feedback reminders (0,5 CFU) a) Amplifiers and filters b) Comparators 3) Memories (1 CFU) a) ROM, OTPROM, EPROM, EEPROM, Flash b) Static and dynamic RAMs c) Timing diagrams d) Memory composition and microprocessor interfacing e) Memory hierarchies and caches 4) Programmable logic (1,5 CFU) a) Programmable devices: PAL, PLA, CPLD b) Field Programmable Gate Array (FPGA) c) Technologies for FPGA d) Design flow e) FPGA resources (memories, multipliers, PLL, clock) f) IP selection, use and applications 5) Input/Output (1,5 CFU) a) Reminders on serial and parallel protocols, delays, skew b) Synchronous transmission and clock data recovery c) Examples: UART, SPI, I2C, CAN, USB d) Interconnection and signal integrity problems 6) Processor peripherals (2 CFU) a) General introduction to embedded processors and their peripherals b) Internal structure, address decoders, configuration registers c) Microprocessor interfacing: polling, interrupt, DMA d) Communication bus: AMBA 7) A/D and D/A conversion (1,5 CFU) a) Reminders on A/D and D/A conversion systems, sampling, aliasing, quantization, errors, ENOB b) D/A converters (classification, parameters, linear and non-linear errors) c) D/A converter circuits d) A/D converters (classification, static and dynamic parameters, linear and non-linear errors) e) A/D converter circuits (Flash, SAR, pipeline, staircase, tracking) f) Signal conditioning, anti-aliasing filter design g) Advanced converters (delta, sigma/delta) 8) Power electronics (1,5 CFU) a) Linear and PWM driving of loads b) Basic design principles of a voltage regulator c) Linear regulators (drop-out, ripple, currents) d) Switching regulators (Buck, Boost, Buck-Boost) e) Voltage references

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa; Elaborato progettuale individuale;
Exam: Written test; Optional oral exam; Individual project;
... Written exam (3 hours time) with theoretical questions and numerical exercises and/or design, with a total of 5 questions/exercises, possibly with an optional oral discussion. With the written exam only it is possible to get 30/30 with honors. The optional oral exam can increase or decrease the final grade. During the written exam it is not possible to use books, notes or other material. Questions and exercises evaluate the theoretical knowledge and the capacity to apply it to practical cases. Reports for the laboratory sessions contribute to the final evaluation (up to 2 points). Individual projects can be considered in place of the written exam.

C. Passerone, "Analog and Digital Electronics for Embedded Systems", CLUT, 2015 (reference text) F.Vahid, T. Givargis, "Embedded System Design: A Unified Hardware/Software Introduction", John Wiley and Sons Jan Rabaey, "Digital Integrated Circuits. A Design Perspective", Pearson Education, 2003 W. Dally, J. Poulton, " Digital Systems Engineering", Cambridge University Press. Course slides and solutions of past exams will be uploaded on the course web site.

• Saper calcolare i parametri prestazionali (e.g. guadagno, dinamica, banda, rumore, distorsione) degli amplificatori CMOS elementari - Conoscere le principali topologie degli amplificatori a alto guadagno in tecnologia CMOS (OpAmp, OTA) - Saper progettare i circuiti analogici di front-end (amplificatori e filtri) basati su amplificatori operazionali - Conoscere i diversi tipi di convertitori A/D e D/A - Saper progettare sistemi per l'acquisizione dei segnali analogici - Saper analizzare e progettare i principali circuiti di pilotaggio dei carichi di potenza - Saper progettare i principali convertitori DC-DC (buck, boost, buck-boost).

Insegnamento obbligatorio (in alternativa a 'Analog and Telecommunication Electronics' in lingua inglese) per la Laurea Magistrale in Ingegneria Elettronica. Lo sviluppo dei sistemi elettronici che governano sistemi e apparati meccanici, elettrici, chimici, etc., o sistemi per la trasmissione dell’informazione, si basa sul progetto di componenti e moduli hardware in grado di acquisire i segnali provenienti dai sensori, di pilotare attuatori e di trasferire l’informazione digitale mediante reti cablate o reti wireless. In questo contesto, l’insegnamento di “Elettronica Analogica e di Potenza� presenta i circuiti di condizionamento dei segnali analogici (amplificatori, filtri e circuiti di protezioni), di conversione analogico-digitale e digitale-analogico e i circuiti di potenza per il pilotaggio degli attuatori e la conversione statica dell’energia elettrica (convertitori DC-DC). Gli argomenti trattati sono essenziali nella professione dell’ingegnere elettronico e per questo motivo le lezioni teoriche sono supportate da esercizi di progettazione in aula e da esercitazioni sperimentali in laboratorio.

Argomenti trattati nelle lezioni e relativo peso in crediti. - Stadi di amplificazione elementari CMOS. Calcolo dei parametri prestazionali come guadagno, banda e output swing. - Circuiti di amplificazione di tipo "single-ended" e "fully differential" basati su amplificatori operazionali - Amplificatori ottimizzati per circuiti a bassa tensione di alimentazione, alto guadagno, basso rumore, banda larga (5 CFU) - Stadi finali di potenza (1CFU) - Interferenze e rumore. Circuiti di cancellazione. (1CFU) - Conversione A/D e D/A, parametri, errori, circuiti per ADC e DAC, (1 CFU) - Circuiti lineari e a commutazione per il pilotaggio dei carichi di potenza. Circuiti di protezione. - Regolatori di tensione lineari e a commutazione (convertitori DC-DC) , pompe di carica. (2 CFU)

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

Testi e materiale didattico - Appunti delle lezioni fornite dal docente. - Testi delle esercitazioni di laboratorio. Testi consigliati per approfondimenti: - P. R. Gray, P.J. Hurst, S.H. Lewis, R.Meyer - Analysis and Design of Analog Integrated Circuits (4th ed.), Wiley, 2001 - B. Razavi - Analog Integrated Circuits Design, Wiley, 2001 - S. Franco - Design with Operational Amplifiers and Analog Integrated Circuits (3rd ed.), McGraw-Hill, 2002 - R. van de Plassche - CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters, 2nd ed., Kluwer, 2003 - Erickson, Maksimovic - Fundamentals of Power Electronics, Springer; 2nd edition (January 2001)

By the end of the course, students will be able to identify and classify Ordinary Differential Equations (ODEs) and Partial Differential Equations (PDEs) underlying mathematical models of engineering problems, and they will acquire foundational knowledge of finite difference and finite element methods for solving such equations. In addition, students will develop the skills to design and implement efficient numerical methods for ODE/PDE-based engineering problems using Matlab.

Il corso è tenuto in inglese. Il corso introduce i metodi numerici per la risoluzione di equazioni differenziali ordinarie e alle derivate parziali, affrontando sia gli aspetti teorici sia quelli applicativi. L'obiettivo principale è fornire agli studenti le conoscenze e le competenze pratiche necessarie per eseguire simulazioni numeriche efficienti di problemi classici dell’ingegneria, una competenza essenziale per corsi avanzati e per progetti di laurea magistrale. Un aspetto centrale del corso è quello di fornire agli studenti una solida conoscenza delle metodologie nel calcolo numerico e addestrarli all’uso del software Matlab, affinché siano in grado di risolvere numericamente, con l'ausilio del calcolatore, alcuni problemi che comunemente si presentano nelle applicazioni dell’ingegneria. In particolare, tali conoscenze consentono agli studenti di individuare tra i metodi a loro disposizione quello più efficiente, sia in termini di complessità computazionale che di occupazione di memoria, per la risoluzione di un determinato problema, e di fare un’analisi critica della soluzione ottenuta. Questa capacità è particolarmente importante per gli ingegneri chimici che si troveranno a utilizzare codici commerciali per risolvere problemi complessi, come ad esempio quelli connessi con i processi di trasformazione dei materiali. Infatti, grazie a questo insegnamento, gli studenti acquisiscono le competenze matematiche necessarie per evitare risultati non attendibili o comunque poco accurati, che potrebbero derivare da scelte non adeguate degli algoritmi.

INTRODUCTION (4 hours) Lectures: Generalities on ordinary and partial differential equations. Examples of classical differential problems, in particular with reference to the chemical engineering ones. Stationary problems, eigenvalue problems and evolution problems. Classification of second order equations. Initial-value and boundary-value problems. Strong and weak solutions. FEM FOR LINEAR STATIONARY PROBLEMS (40 hours) Lectures and problem sessions (28 hours): • The Finite Element Method (FEM) for second order linear elliptic problems defined on bounded intervals or on bounded plane domains. • Sobolev spaces and weak formulations of differential problems. Integration by parts and Green’s formulas. • Problem space domain discretization. Finite elements and finite element spaces. Definitions and examples. Some main results on approximation theory. • Application of the FEM to linear elliptic problems, first defined on bounded intervals, and then on bounded plane domains, with different types of boundary conditions (Dirichlet, Neumann, Robin, mixed-type, of periodicity). • Some basic convergence results. • Eigenvalue problems. • Construction of the FEM stiffness matrix and solution of the associated linear system. • Numerical integration formulas. Conditioning of a linear system. Basic methods for the numerical solution of linear systems. Computer Lab sessions (12 hours) FEM FOR LINEAR TIME-DEPENDENT PROBLEMS (16 hours) Lectures and problem sessions (10 hours): • Weak formulations in the space domain of parabolic and hyperbolic problems, in particular of transport and wave propagation problems. Application of the FEM. • Basic on initial value ODE problems. • Finite difference schemes for the time discretization of ODE systems generated after performing the (space) FEM discretization. Computer Lab sessions (6 hours) NUMERICAL METHODS FOR ODE INITIAL-VALUE PROBLEMS (IVP) (10 hours) Lectures and problem sessions (7 hours): • One-step methods and convergence results for the solution of IVP-ODEs. • Stiff problems and numerical methods for their resolution. Computer Lab sessions (3 hours) FINITE DIFFERENCE METHODS FOR PDE BOUNDARY-VALUE PROBLEMS (BVP) (10 hours) Lectures and problem sessions (7 hours): • Finite difference methods for elliptic, parabolic and hyperbolic BVP-PDEs. • Stability and convergence results. • Reaction-diffusion-transport problems and numerical stabilization for transport dominating ones. Computer Lab sessions (3 hours)

Modalita di esame: Test informatizzato in laboratorio; Prova scritta (in aula);
Exam: Computer lab-based test; Written test;
... The exam consists of two tests: the first is an computer test, the second is a written test. The first test, to be held in the computer Lab, consists of 4 multiple-choice questions concerning the course topics. In this test students must show to be able to solve, by applying the numerical methods described in the lectures and by preparing short Matlab scripts, problems similar to those that have been solved during the Lab course sections. This to verify the students’ knowledge of the algorithms presented during the course and their programming and computing skills. Students must use the Matlab software installed in the Lab PC, and they are not allowed to use books, notes, personal PC and any electronic device. The maximum grade is 16 points: each correct answer is worth 4 points, an unanswered question is worth 0 points, and an incorrect answer results in a 20% penalty. The Lab test is scheduled for about an hour and a half. The second written test, to be held in a lecture room the same day of the Matlab test, consists of two/three exercises that include both practical and theoretical questions, covering the entire course content. The written test is scheduled for about an hour and a half and is worth up to 16 points. During the exam, it is forbidden to use books, personal material such as notes and handouts and any electronic device. The final grade is the total of the two test scores. A minimum score of 18 is required to pass, while full marks with all correct answers are awarded with honors (cum laude).

Lecture notes, as well as notes on the computer lab sessions, can be downloaded by the students from the Portale della Didattica. Further reading: A. Quarteroni, Numerical Models for Differential Problems, Springer Verlag, 2009. A. Quarteroni, F. Saleri, P. Gervasio, Scientific Computing with MATLAB and OCTAVE, Springer, 2014.

• Capability to represent multi-port devices with equivalent matrices and to relate the properties of the latter to the physical characteristics of the component they represent. - Knowledge of the operation principles of the main microwave an millimeter-wave passive components. - Capability to design microwave components in microstrip technology. - Capability to use simulation tools for microwave components. - Capability to measure microstrip components. - Knowledge and ability to model noise and interferences on transmission lines. - Knowledge of basics of emissions and susceptibility of components and systems, and of the techniques for their suppression.

The course is taught in English. The course illustrates the principles of operation, and provides the design criteria of the main passive components used in microwave and millimeter-wave systems. The course also provides an introduction to electromagnetic compatibility, with particular emphasis on signal integrity, conducted and radiated interference, and mitigation of interference due to electromagnetic fields in electronic devices.

Conventional transmission line review, introduction of Multiconductor transmission Lines and of S-parameters for the representation of N-port devices (1 CFU) Microwave components, their characterization and design techniques, and their use in microwave systems. (4 CFU) Signal integrity: distortions due to mis-matching, cross-talk. (1 CFU) Rediated field review, introduction of radiated emissions and susceptibility. (1 CFU) Numerical and experimental characterization of the considered devices, EMC measurements (1 CFU)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... The main aim of the exam is to verify the learning level of the course topics, i.e. the capability to design the passive components that are commonly present in the RF block of an electronic circuits, to perform their critical analysis, to quantify the effects of interferences and to find possible solution for their reduction. The final score is expressed in thirtieths. The minimum score to not fail the exam is 18/30. The exam consists in a mandatory written test, consisting in three exercises, devoted to verify the knowledge of the subject matters. Its aim is to verify the acquisition of the course competences (see expected learning outcomes) through the solution of exercises in which problems similar to those solved during exercise classes or porposed in the weekly assignements have to be solved. It is possible to pass the exam with the written test only, but in this case the maximum achievable score is 27/30. Its duration is 2 hours. For the written test, students need only to take with them what is necessary to write and the calculator. Na books, solved exercises or notes are allowed. The usefull formula are directly added to the exam text. The results of the written test are posted on the course website. Students have the possibility to see their written exam and to discuss it, in a predefined day. If the written test has a score at least equal to 18/30, it is possible to improve the final score according to the following different ways, that are not mutually exclusive. - An oral test, mostly aimed to check the more theoretical aspects of the topics debated during the course; it could increase or decrease the final score with respect to that of the written test. - The submission of the assigned exercises (homeworks); their aim is to help the students to deal with the different subject matters immediately after their explanation, to have the possibility of asking clarifications without waiting for the end of the course. - The submission of a short report on the optional project activity. It will consist in the design, numerical characterization and measurements of one of the devices considered during the course (e.g. a filter). The course instructors are responsable for its manufacturing. The activity is carried on in small groups (2-4 people). One report for each group is required, to be delivered before the end of July's exam period. The aim of this activity is to teach students to face a "real problem", learning to use a commercial tool for the numerical analysis of the component, and to discuss the effects of manufacturing tolerances and the possible discrepancies between computed and measured results. The total number of points that could be gained with the assignments and the projects are four.

Material available on the web portal: classes slides, assignments, collection of useful formulas Suggested textbooks: - D. Pozar, "Microwave engineering" - C. Paul: "Introduction to electromagnetic compatibility"

• Knowledge of the basic issues related to the high speed and optoelectronic devices - Knowledge of the advanced technologies for high speed electron and optoeletronic devices - Knowledge of high speed electron devices operation along with their descriptive models - Basic knowledge of the operation of selected optoelectronic devices (photodiodes and electro-optic modulators) - Basic knowledge of the specific features of the main semiconductor devices for power applications - Capability to exploit physics-based mathematical models for the analysis and the design of high frequency electron devices (MESFETs, HEMTs, HBTs) - Capability to exploit small-signal equivalent circuit models of high frequency electron devices (MESFETs, HEMTs, HBTs)

The course, taught in English, is mandatory as an alternative to Optoelettronica for the MSc-level program in Electronic Engineering. The course goal is to complete the student knowledge in the field of semiconductor devices with the topics related to advanced electron devices for high-speed and optoelectronics applications. Field effect transistors for high frequency applications will be presented, with particular reference to the MESFET and the various electron devices based on heterostructures, such as the HFET, the HEMT and the bipolar HBT transistor. The course includes an introductory overview of optoelectronics and optoelectronic devices, such as photodetectors and electo-optic modulators, and a brief description of power semiconductor devices. Competences acquired in the High Speed Electron Devices course will be applied, both at the theoretical and experimental levels, in several following Electronics course, in particular for analogue applications.

• Review of semiconductor theory (0.5 cr) - Metal-semiconductor junction and MESFET transistor (1.5 cr) - Heterostructures: technology and band diagram (0.5 cr) - Heterostructure FET: HFET, HEMT (1.5 cr) - Heterostructure bipolar transistor HBT (1 cr) - Optoelectronic and power electronics devices (1 cr)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... The goal of the examination is to verify the knowledge of the topics listed in the Contents section and the capability to apply them to exercise solution. The exam is made of a 2 hour written test and of a voluntary oral examination. Access to the oral examination requires a grade for the written examination at least equal to 18/30. The final grade is obtained combining both the written and oral part partial grades. -Written test (weight 0.85): consists of an open theoretical question, of a numerical exercise, and of a set of about 5 closed answer questions. The value of the three parts is approximately the same. The main equations introduced during the lectures and made available to the student through a “list of formulae�; -Oral test (weight 0.15): to gain access to the oral test the students must have obtained an evaluation of the written test at least equal to 18/30. The oral examination is devoted to the assessment of a proper knowledge of the theory discussed during the lectures and will possibly include the discussion of the written test. The theoretical topics that may be discussed during the oral test are listed in the Contents section. Normally the oral test has to be taken right after the results of the written test are provided.

Lectures will exploit slides made available in advance to the student and projected in class with the projection system. All the produced material will be made available on the course website as pdf files. Exercises are discussed and solved in room. Homework exercises are also provided in .pdf format for self-learning and preparation of the final exam. Suggested references are: G. Ghione Semiconductor Device for High-Speed Optoelectronics, Cambridge University Press (2009); S.M. Sze, K.K. Ng, Physics of semiconductor devices, Wiley (2007); G. Ghione Dispositivi per la Microelettronica, McGraw Hill (1998).

Al termine dell'insegnamento, gli studenti saranno in grado di: -applicare una metodologia strutturata di progetto all'analisi e allo sviluppo di applicazioni software per sistemi embedded; -utilizzare il linguaggio Bash e i principali strumenti di scripting UNIX per automatizzare operazioni su file, flussi di dati e processi; -impiegare strumenti di versioning e workflow collaborativi basati su Git per la gestione di progetti software in evoluzione; -comprendere e applicare i principi della programmazione in C per sistemi embedded, con particolare riferimento a gestione della memoria, organizzazione modulare del codice, processo di compilazione, makefiles e cross-compilazione; -sviluppare semplici applicazioni embedded su piattaforme STM32, in contesti bare metal e con supporto RTOS; -descrivere e utilizzare i principali meccanismi di un sistema operativo real-time, inclusi scheduling, task, gestione della memoria, code, semafori, mutex, event groups e interrupt; -analizzare soluzioni software per applicazioni a basso consumo in ambiente embedded; -utilizzare il linguaggio C++ per sviluppare codice modulare e riusabile, con classi, file processing, STL containers, STL algorithms e meccanismi di overloading, inheritance e polymorphism; -lavorare in gruppo nello sviluppo di attività di laboratorio, documentando il processo di progetto, giustificando le scelte implementative e utilizzando correttamente gli strumenti introdotti a lezione.

L'insegnamento è tenuto in italiano. Insegnamento facoltativo per il Corso di Laurea Magistrale in Ingegneria Elettronica, collocato nel primo periodo didattico del primo anno. L'insegnamento di Integrazione di Sistemi Embedded è finalizzato a fornire agli studenti una visione metodologica e operativa degli strumenti necessari per progettare, sviluppare e integrare sistemi embedded complessi. Il corso affronta il problema dell'integrazione tra componenti software, strumenti di sviluppo, sistemi operativi real-time e piattaforme embedded, con particolare attenzione alla qualità del codice, alla modularità del progetto e all'automazione del flusso di sviluppo. Il percorso formativo inizia dalla metodologia di progetto e dalla structured programming, per poi introdurre i linguaggi di scripting e il Bash shell command language come strumenti per l'automazione, la manipolazione dei file, il controllo di flusso e la gestione dei processi. Vengono inoltre trattati i sistemi di versioning, con particolare riferimento a Git e ai workflow collaborativi, e gli aspetti fondamentali della programmazione in C per sistemi embedded, tra cui gestione della memoria, organizzazione dei progetti, compilazione, makefiles e cross-compilazione. Una parte rilevante del corso è dedicata ai sistemi operativi real-time, con particolare riferimento a FreeRTOS su piattaforme STM32. In questo contesto vengono introdotti i meccanismi di scheduling, la gestione dei task e della memoria, le code, i semafori, i mutex, gli event groups, la gestione degli interrupt e le tecniche per applicazioni a basso consumo. Il corso si completa con una parte dedicata al linguaggio C++, utilizzato come strumento per l'automatizzazione dei processi, con richiami ai fondamenti del paradigma object-oriented, alle classi, alle funzioni, alla gestione dei file, ai container STL, agli algoritmi e al polimorfismo. L'insegnamento integra lezioni, esercitazioni e laboratori, con l'obiettivo di sviluppare competenze applicative nella progettazione e nello sviluppo collaborativo di software embedded strutturato, portabile e manutenibile.

Metodologia di progetto e structured programming (0,5 CFU) Analisi delle specifiche, decomposizione del problema, progettazione top-down, flowchart, organizzazione del codice. Linguaggi di scripting e Bash (1,5 CFU) Introduzione ai linguaggi di scripting, shell Bash, file system e comandi di base, pipeline e data filtering, espressioni regolari, sed, awk, grep, controllo di flusso e gestione dei processi. Versioning e sviluppo collaborativo (0,5 CFU) Sistemi di version control, Git, repository, branching, remotes, workflow e strumenti GitLab. Programmazione C per sistemi embedded (1,5 CFU) Gestione della memoria, buone pratiche di coding, organizzazione modulare dei progetti, processo di compilazione, toolchain, makefiles, cross-compilazione, ambienti STM32. Sistemi operativi real-time per applicazioni embedded (1,5 CFU) Introduzione ai RTOS e a FreeRTOS, gestione dei task, scheduling, memoria, queue, semafori, mutex, event groups, interrupt management e applicazioni low-power. C++ per l'automatizzazione dei processi (2 CFU) Sintassi del linguaggio, funzioni, strutture dati, classi, file processing, STL containers, STL algorithms, overloading, inheritance e polymorphism, con applicazioni all'automatizzazione dei processi di simulazione.

Modalita di esame: Prova scritta (in aula); Prova scritta in aula tramite PC con l'utilizzo della piattaforma di ateneo;
Exam: Written test; Computer-based written test in class using POLITO platform;
... L'esame è finalizzato a verificare il raggiungimento dei risultati di apprendimento attesi, con particolare riferimento alla capacità di applicare una metodologia strutturata di progetto, utilizzare gli strumenti di scripting e versioning, sviluppare e analizzare codice in C e C++ per sistemi embedded, e comprendere i principali meccanismi dei sistemi operativi real-time e dei flussi di compilazione e integrazione del software embedded. L'85% del voto dipende da una PROVA SCRITTA: La valutazione finale consiste in una prova scritta individuale e nella valutazione individuale delle attività di laboratorio. La prova scritta ha durata di due ore e comprende tre esercizi inerenti ai linguaggi di programmazione, C++, Bash, RTOS, Git più un'eventuale domanda a risposta aperta sugli aspetti più teorici del corso. Durante la prova scritta non è consentita la consultazione di libri, appunti o altro materiale didattico. Il 15% del voto finale dipende dal lavorso svolto in LABORATORIO durante il semestre: Le attività di laboratorio sono svolte in gruppo, ma la valutazione è individuale e viene formulata in base: (a) alla consegna degli esercizi svolti tramite portale della didattica (b) la relativa discussione che avviene durante il laboratori stessi Nello specifico, la valutazione della parte laboratoriale tiene conto della qualità del lavoro svolto, della discussione durante i laboratori di verifica in termini di: chiarezza nell'esposizione, scelte progettuali e implementative, dell'uso corretto degli strumenti introdotti nel corso, e della presenza. All'inizio del corso viene fornito un calendario con tutte le date dei laboratori, le date per la consegna degli elaboratori e delle relative discussioni orali. I voti dei laboratori vengono pubblicati alla fine del corso. La prova scritta pesa l'85% della valutazione finale, mentre la parte laboratoriale pesa il 15%. Il voto finale è espresso in trentesimi.

I testi di riferimento che coprono una parte significativa degli argomenti dell'insegnamento sono: Cameron Newham, Learning the Bash Shell, O'Reilly Media. Arnold Robbins, sed & awk, O'Reilly Media. Jon Loeliger, Version Control with Git. Scott Chacon, Ben Straub, Pro Git. Testi e materiale didattico sul linguaggio C++ tratti da Paul Deitel e Harvey Deitel, C++: How to Program. Mastering the FreeRTOS Real Time Kernel" from Richard Barry Ulteriore materiale didattico, lucidi e manuali per le esercitazioni di laboratorio sono resi disponibili tramite il portale della didattica.

The purpose of the course is to provide the basic knowledge of space missions and systems, helping the development of capabilities in formulation and solution of problems related to the design, realization and operation of space systems. Students will attain basic knowledge of the following topics: space system types, their application context, and ground support systems; technical features of on-board systems and subsystems, both in terms of operation tasks and necessary technologies. Specific objectives are knowledge of: specificities of space missions in terms of operational and functional characteristic; different types of space systems (both manned and unmanned) in orbit (satellites, probed, transfer vehicles, space stations) and on ground for planetary exploration (landers, rovers, and permanent habitats); space operational environment ad spaceflight mechanics most relevant operational orbits on board subsystems; relative dependence among mission requirements/constraints and features of the space systems, and relations at the system-subsystem lavel;

The main objective of the course is to contribute to the education of the mechatronic engineer, providing the basic knowledge on missions and space systems that represent an application field of relevant interest for the most innovative solutions of mechatronic engineering. The course offers a path aimed at learning knowledge and skills training in the field of Space Systems, i.e. complex innovative systems featuring novel technology, integrated within modern engineering systems for transport and telecommunications, and used for societal services like navigation, remote sensing and monitoring, and Internet of Things. The course therefore aims at developing in the student a multidisciplinary and critical mindset, providing the basic knowledge and tools necessary to understand Space Missions and the Systems that carry them out. Modern Space Systems are characterized by a high degree of complexity, mainly due to the multiple relationships and interactions between the elements that constitute the system itself and the different systems that contribute to the realization of the Space Mission. The skills acquired throughout the course are functional to support and encourage the student's inclusion in a high-profile professional context, in industry and in research centres in the aerospace domain and related fields, such as the automotive industry and robotics in general.

Space systems Introduction to the concept of system as integration of several systems and elements. System engineering as an approach and method for the design and operation of space systems and missions (3h). Introduction to the application context od space systems: challenges and opportunities of space exploration and exploitation(1.5h) Space environment and ots effect on space systems (3h). Type of space systems in the gereral context of space missions: orbital systems (satellites, probes, transport vehicles)m surface systems(landers, rovers), launchers, ground stations (4.5h). Payloads (3h). Electric power generation, storage, conditioning and distribution: electric power system (3h). Thermal protection and control (3h). Telecommunication system (3h). Data and command handling (3h) Astrodynamics principles of spaceflight mechanics: two-body problem, angular momentum and energy of orbits, keplerian orbits. orbital elements, reference systems, and ground track (5h). Geocentric orbits: classification, orbital transfers with impulses, orbital perturbations and their effect of orbital elements (5h). Relative motion and GNC: relative motion equations, exaples of proximity maneuvers, rendezvous and docking.equazioni del moto relativo tra due satelliti in orbita, esempi di manovre di prossimità , rendezvous and docking, strategie di Guidance, Navigation and Control (GNC)(5h). Rigid body rotational dynamics: Euler equations for rotational motion, Euler's angles and quaternions, torque-free motion and active attitude control (5h). Propulsion system Principles of space propulsion, thrust and specific impulse (3 h). Maneuvers, structural loads during launch (4.5 h). Chemical propulsion and electric propulsion: thrusters and operations, subsystems (7.5 h). Feed systems (3 h).

Modalita di esame: Prova scritta (in aula);
Exam: Written test;
... The exam is written, with multiple-choice questions and open-ended questions. The length is 1.5 hours. Maximum mark 30/30.

Cornelisse, J.W., Schoyer, H.F.R., and Wakker, K.F., Rocket Propulsion and Spaceflight Dynamics, Pitman, London, 1979.

As the outcome of the course, students will be able to - Analyze the behavior of the micro- and nano- scale devices, including the related problematic linked to geometric scaling and technology fabrication issues - Identify the correct models for representation of the electron device behavior, both through analytic/compact models anfd through technology CAD software (Synopsys Sentaurus). - Include the main non-ideality effects into the models (high field, multi-dimensionality, quantum effects, quantum confinement), and link their solution to the main developments of the fabrication technology. - Identify the correct modeling approach for the nano-scale devices - Orient their knowledge and future work within the scenario of the nanoelectronic device research field, with solid background on the problems that still need for solution, the future needs and expected developments both at the technology level and in the area of advanced modeling.

The course is taught in English. The course aims at providing a solid knowledge on the operation of the main semiconductor devices for the micro and nanoelectronics applications. The first part of the course is dedicated to the evolution of the MOS transistor technology, with emphasis on the CMOS applications. The FinFET transistor is addressed both from the technological and the modeling standpoint. The second part of the course is dedicated to emerging nanoelectronic devices, with particular emphasis on CMOS replacement and novel memory/storage devices, including the junctionless transistors, the tunneling transistors and lower dimensionality structures. The course provides the fundamentals for understanding the devices operation, starting from their physical structure and using the concepts of the semiconductor physics. The devices are analyzed at all levels, starting from the fabrication process, the modeling and simulation through CAD tools, highlighting the problems related to non-idealities and scaling issues.

• Technology roadmaop and physical limitations of miniaturization. Scenario of the micro- an nano-electronics. (0.45 credits). - Advanced modelling for the MOS transistor. (0.9 credits) - Submicron MOSFET: scaling and nonidealities issues (0.9 credits) - FinFETs (0.6 credits) - Junctionless, Tunneling and Negative Capacitance transistors (0.6 credits) - Emerging technologies (0.6 credits) - Assisted laboratory practice using a commercial CAD tool for the physics-based simulation of semiconductor devices. (1.95 credits)

Modalita di esame: Prova orale obbligatoria; Elaborato progettuale in gruppo;
Exam: Compulsory oral exam; Group project;
... The final exam consists of an oral exam (30 min.) and a laboratory test (15 min.). The oral exam aims at assessing the knowledge of the theoretical part whereas the laboratory test is aimed at assessing the capability gained in the numerical simulation of advanced electron devices. The Lab test includes always the discussion of the laboratory reports prepared in groups. The oral exam vote is up to 25. The lab vote, up to 5 points, summarizes the evaluation of the written laboratory reports (group-wise) and the individual lab exam. The exam is passed only if both the oral and lab parts are sufficient.

Reference textbook: Yuan Taur, Tak H. Ning Fundamentals of modern VLSI devices Cambridge University Press 2nd edition Teaching material from the professor: - Review of the semiconductor physics required as the background knowledge for this course (self-learning) - Course slides - Guidelines for the lab work -Further material for advanced topics

• Knowledge of MOS based topologies and of its technology, of the related digital gates of their description at different level of abstraction and of their performance (standard cell libraries) - Knowledge of problems related to signal and power supply interconnects in integrated circuits and of the related design aspects - Ability to design microarchitectural structures to be used as foundamental block in a digital integrated system for signal processing, as arithmetical blocks, hardwired and microprogrammed control systems and memory systems - Knowledge of the manyfold techniques for describing, simulating and designing at circuit, architecture and system level, aiming at performance optimization (area, frequency, throughput, power consumption) - Ability in using CAD tools aiding the design of integrated circuits on scaled technologies: HDL simulators, synthesizer, place&router, layout editors, physical level simulators - Ability in analyzing specifications and contraints when designing complex digital systems and choosing the correct algorithm - Ability in evaluating computational complexity, interconnect bandwidth and numerical choices (number precision and data representation) for complex elaboration circuits - Knowledges on derivation of constraints on architecture, on resources allocation and scheduling - Skill in the design of multi clock regimes - Knowledge on control systems as hardwired and microprogrammed control units - Basic knowledges on parallel integrated architectures

The course is taught in English. The course is optional for the MSc-level programme in both Electronic Engineering and Computer Engineering. It will be offered in the second period of the first academic year. It aims at analyzing the design methodologies of complex microelectronic systems based on scalded MOS devices, considering the constraints and critical issues in designing architectural and microarchitectural blocks and detailing the technological aspects native to the design of structures based on devices and interconnections that are the state of the art od digital electronics. The analyzed aspects will be applied to some cases of study in laboratory sessions based on the use of specific CAD tools like HDL simulators, synthesizers, place&routers, layout editors, physical level simulators.

Case study of complex architectures as examples of microelectronic system: multithreading structure (T2 Ultrasparc), CISC/RISC structure (Pentium 4), structure for embedded systems (ARM 11). (0,5 CFU) Case study of internal microarchitecture for each of the systems mentioned (P4 adder, multiplier and logic block T2, ARM divider, windowed register file for multithreading from T2). Control units based on FSM, Hardwired and microprogrammed. (1,2 CFU) Digital MOS gates both combinational ads sequential based on different topologies (CMOS, domino, DCVSL, transmission gate, C2MOS, TSPC) analyzed for what concerns figures of merit used during the design of a integrated digital circuit (function, area, timing, power): abstraction levels of a library of gates, for low level simulation, physical design, synthesis and high level simulations. (1,5 CFU) Description of interconnects and their parasitic parameters; modeling and design criteria; Temporization and clock domains, technological phases. (1 CFU) Top down design of microelectronic systems based on previously described blocks: basics on architectural and topological solutions for performance optimization, synthesis techniques, physical design and post-layout verification (mainly in laboratory). (1,8 CFU).

Modalita di esame: Prova orale obbligatoria; Elaborato progettuale in gruppo;
Exam: Compulsory oral exam; Group project;
... The final examination consists in three part: E1 oral exam, E2, laboratory exercises, E3: a final project. E1: The oral exam is related to the whole program and is related to all the subjects analyzed during classes and laboratories. E2: The laboratory execises are evaluated for completeness, correctness and accuracy and timeliness. E3: The project will consist in the development of an architecture as a case of study, in its simulation and top-down design and optimization of the typical criticalities related to a medium-high complex architecture based on a scaled technology. The project must be completed within the starting date of the academic year following the one of the attended course. The student can choose among three different combinations: Choice 1: the exam can be completed with part E1 (weight 60%) and part E2 (weight 40%), but the final evaluation will be saturated to a maximum of 26/30. Choice 2: the exam can be completed with part E1 (weight 45%), part E2 (weight 15%), where the project (E3) is developed as a basic version based on several elements already developed during the lab. The final evaluation will be saturated to a maximum of 26/30. Choice 3: the exam can be completed with part E1 (weight 45%), part E2 (weight 15%), where the project (E3) is developed as a more evolved versione enriched of innovative and more complex and challenging elements. The final evaluation will be saturated to a maximum of 30/30 cum laude. Overall the E1, E2 and E3 parts aim at evaluating not only the knowledges related to the subjects analyzed, but especially the capability to observe the problems arising during the design of a microelectronics system, to understand the trade off among the possible design choices, to define a creative strategy and to find a solution in order to optimize a design, being aware of the consequences, risks and possible future improvements.

Lectures notes of all the lectures ara available as well as laboratory guide. Books suggested are: 1) M. Rabaey, Anantha Chandrakasan, and Borivoje Nikolic´: Digital Integrated CircuitsSecond Edition, Prentice-Hall, 2) N.Weste D. Harris, CMOS VLSI Design: A Circuits and Systems Perspective, Addison-Wesley 3) J.hennessy, d.Patterson, Computer Architecture: a Quantitative Approach, Addison-Wesley Some suggested readings are in the form of research papers related to the most up-to-date subject analyzed. The learning material is available through the official course website.

Al termine dell'insegnamento studentesse e studenti avranno acquisito le seguenti capacità e conoscenze: • Conoscenza del comportamento del dispositivo MOS in presenza degli effetti di canale corto e di saturazione di velocità . • Capacità di derivare un modello semplificato del dispositivo in regime di commutazione a partire da simulazioni o misure. • Conoscenza delle caratteristiche statiche, dinamiche e di potenza dell’invertitore logico. Capacità di determinare tali caratteristiche a partire da modelli semplificati dei dispositivi. • Conoscenza degli strumenti di descrizione di un circuito a livello schematico e della caratteristiche degli strumenti di simulazione. Capacità di utilizzare strumenti commerciali per descrivere a simulare a livello elettrico semplici circuiti digitali. • Conoscenza dei processi di base CMOS bulk ed SOI e degli strumenti di descrizione a livello di layout. Maschere e regole di progetto. Capacità di realizzare layout di semplici circuiti, di verificarli a livello di regole di progetto e a livello di confronto con la descrizione schematica. • Conoscenza delle strutture logiche CMOS complementari, pseudo nMOS, a transmission gate e dinamiche. • Capacità di progettare il modello schematico di porte elementari e di valutare il loro ritardo a partire dalla descrizione funzionale. • Conoscenza delle metodologie elementari di dimensionamento delle porte logiche in un circuito complesso per l’ottimizzazione dei ritardi. Capacità di applicare tali metodologie per l’ottimizzazione di un singolo cammino critico di circuiti reali. • Conoscenza dei moduli di memorie elementari e delle strutture di memoria organizzate. Capacità di analizzare e simulare il comportamento di una memoria RAM statica. • Conoscenza dei passi principali del flusso di progetto dal livello di trasferimento tra registri (RTL) a maschere di fabbricazione, e della funzionalità degli strumenti CAD da esso utilizzati.

L'insegnamento si propone di fornire le basi per la progettazione di sistemi microelettronici digitali, dal dispositivo elementare fino al blocco funzionale di media complessità , analizzando le tematiche ed i problemi delle varie fasi di progetto e sviluppo di un circuito integrato digitale e gli strumenti CAD di ausilio al progetto stesso.

Gli argomenti trattati sono i seguenti, con indicazione del numero di ore dedicato a ciascuno: • Modelli di dispositivi per applicazioni digitali (4h) • Processi di fabbricazione e interfacce con progetto layout e logico (4h) • Invertitore logico (6h) • Logica statica e dimensionamento multistadio (8h) • Ottimizzazione dei ritardi (6h) • Logiche a transmission gate e dinamiche (3h) • Interconnessioni e packaging (4h) • Latch e registri statici e dinamici (3h) • Strutture di memoria ROM e RAM (6h) • Alimentazione, clock e I/O (3h) • Strumenti CAD di sintesi, piazzamento e interconnessione (13h)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... L’esame finale accerta l’acquisizione delle conoscenze e delle abilità attese tramite lo svolgimento di una prova scritta della durata complessiva di 2 ore e 15 minuti e un orale facoltativo richiesto dallo studente. La prova scritta si svolge senza l'ausilio di libri o appunti dello studente. Al fine di verificare il raggiungimento degli obiettivi di apprendimento, e quindi l’acquisizione delle conoscenze e capacità di comprensione e delle capacità di applicarle, la verifica si articola in tre parti. La prima parte, che tende a verificare l’acquisizione della capacità di risolvere problemi pratici di natura progettuale, consta di due esercizi ciascuno dei quali viene valutato con un punteggio da 0 a 10 punti. La seconda parte verte sulla teoria svolta a lezione e consiste in 10 domande a risposta multipla, con quattro risposte possibili per ciascuna domanda di cui soltanto una è corretta. Per ogni risposta esatta viene attribuito 1 punto, per ogni risposta errata il punteggio è negativo e pari a -1/4 di punto. Per ogni risposta non data il punteggio è nullo. La terza parte, facoltativa e riguardante la verifica delle competenze acquisite tramite le esercitazioni di laboratorio, consta di due domande a risposta aperta ciascuna delle quali viene valutata con un punteggio compreso tra 0 e 1 punto. Chi rinuncia alla terza parte facoltativa dovrà consegnare il proprio elaborato non oltre quindici minuti prima della durata complessiva della prova scritta (entro 2 ore dall'inizio della prova). Il punteggio massimo complessivo della prova scritta, ottenuto sommando i punteggi ottenuti nelle tre parti, è pari a 32 punti. Il voto è ottenuto convertendo il punteggio in trentesimi e applicando un arrotondamento all'intero più vicino in caso di voti frazionari (ad es., 27.5 viene convertito in 28/30; 18.4 viene arrotondato a 18/30). La lode viene attribuita in caso di punteggio maggiore o uguale a 31, prima dell'arrotondamento. La prova orale facoltativa consta di domande volte a valutare le conoscenze e competenze teoriche e pratiche acquisite dallo studente e verte sull'intero programma, comprese le esercitazioni di laboratorio. Può essere richiesta dallo studente solo in caso di valutazione positiva della prova scritta (punteggio superiore o uguale a 18/30, dopo l'arrotondamento). Al termine della prova orale viene attribuito a questa un punteggio in trentesimi fino a 32 punti e viene calcolata la media con il voto della prova scritta. La lode viene attribuita in modo analogo a quanto avviene per la prova scritta, ovvero nel caso in cui il punteggio ottenuto con la media sia maggiore o uguale a 31, prima dell'arrotondamento.

Oltre ai lucidi delle lezioni, disponibili sul Portale della Didattica, i testi di riferimento del corso sono "CMOS VLSI Design" (4a edizione), di N. H. E. Weste e D. M. Harris, Addison-Wesley, 2011, e "Digital Integrated Circuits" (2° edizione), di J. Rabaey. A. Chandrakasan, B. Nikolic, Prentice Hall Ed., 2003.

• Knowledge of integrated technologies for RF, microwave and mm-wave active and passive devices. - Ability to analyse linear two-ports from the stanpoint of power gains and stability - Knowledge of linear and nonlinear models of active microwave transistors - Ability to analyse an electronic circuits with noise sources and to design a loaded two-port in order to minimize the noise figure - Knowledge of narrowband, wideband ad ultrawideband microwave amplifier solutions - Ability to computer aided design linear high-gain and low-noise microwave amplifiers - Knowledge of fundamental parameters of quasi-linear microwave power amplifiers - Ability to design and optimize simple narrowband power amplifiers.

The course is taught in English. Microwave Electronics (1st year LM, 2nd term) is a mandatory course in the curricula: RF design, Integrated Electronic and Optoelectronic Devices and Technologies, Wireless System design. It provides the basis for the computer aided design of analog circuits for RF, microwave and mm-waves, with particular attention to linear circuits.

Lectures: - Enabling technologies for analog RF, microwave and millimeter wave analog integrated systems, recalls on transmission lines and distributed and concentrated integrated components (1 CFU) - Analysis of loaded two-port with S-parameter representation, stability and gains (0,5 CFU) - Basics on active devices for micowaves and millimeter waves, small-signal models, large-signal models( 0,5 CFU) - Noise in electronic circuits, two-port noise parameters, active device noise models. (1 CFU) - Design of maximum gain linear amplifiers, design of low-noise amplifiers; examples of microwave and mm-wave topologies: open loop, balanced, feedback, distributed, with inductive degeneration. Basics of class-A power amplifiers. (1 CFU) CAD laboratories (2 CFU): - Simulation and optimization of passive microwave integrated circuits through MWOFFICE - Simulation and optimization of maximum gain amplifiers - Design and layout of a single-stage microwave amplifier.

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

Lecture slides and a trace of the CAD labs is available on the course web site. Reference text: G.Ghione, M. Pirola, "Microwave electronics", Cambridge University Press 2017. A previous version in Italian is also available: G. Ghione, M. Pirola, "Elettronica delle microonde", OTTO editore, 2002, due volumi.

Students will acquire knowledge on wireless distributed network systems and the know-how to effectively apply these technologies to mobility services, system and environmental monitoring and data collection. In particular, students will develop competences on the medium access layer and the network layer of distributed wireless systems, and the ability to design a wireless network given the constraints that typically characterize practical smart city scenarios. In more detail, students will acquire knowledge and ability as reported below: 1. Knowledge of mobile network systems based on device-to-device communications and of sensor network applications. 2. Knowledge of protocols for radio channel access and traffic routing in distributed wireless networks. 3. Knowledge of channel access techniques, adaptive topology formation and traffic routing in wireless sensor networks. 4. Knowledge of the main performance metrics, which are relevant in wireless communication-based systems. 5. Ability to design a channel access protocol for wireless networks. 6. Ability to design a routing protocol for wireless networks under practical constraints and in relevant scenarios. 7. Ability to evaluate the performance of a distributed network system. 8. Ability to assess the suitability of a wireless technology to a given environment for application support.

The course introduces students to the fundamental aspects of communication networks for mobile users and of sensor networks, which represent the main ways to disseminate and collect information in smart cities, smart buildings, health care centers as well as for applications such as environmental monitoring. The course objectives are therefore to let students acquire (i) the necessary knowledge on wireless and mobile communication technologies, and (ii) the ability to apply such knowledge to the support of services for smart cities. Special attention will be given to WiFi-based technologies, device-to-device (or machine-to-machine) communication and to wireless sensor networks. For each application scenario (smart city, health, environmental monitoring), the main network technologies are discussed, along with their performance and the open problems for which a solution is still needed. The students will also learn the methodologies that can be used for modeling such systems and the main results that have been obtained. The knowledge and abilities that students will acquire through this course are relevant to create experts in the design and management of network services, and in the development for services in application domains such as transport, environmental monitoring, domotics, health.

The course includes both lectures and numerical exercises, which focus on wireless distributed systems. In particular, they describe the main existing and emerging technologies and highlight their features and challenges in different application scenarios. The topics covered by the course, and their weight expressed in hours, are as follows: - Mobile networks and device-to-device communication: generalities, classification and main issues (6 h) - Channel access techniques in distributed wireless networks (12 h) - Connected cars: services, network architecture, channel access techniques and main technical challenges (6h). - Performance of distributed wireless networks (4 h) - Proactive and reactive routing protocols for mobile networks (7 h) - The Bluetooth technology (4 h) - Sensor networks: generalities and applications; channel access techniques (5 h) - Network topology control and traffic routing for sensor networks (4 h). Numerical exercises and software demonstrations account for 12 h.

Modalita di esame: Prova scritta (in aula); Elaborato scritto prodotto in gruppo;
Exam: Written test; Group essay;
... The exam consists of a written test, which lasts about 1 hour and a half. No oral exam is foreseen. It is a closed-book exam, i.e., students cannot use textbooks, copy of the slides, or copy of the solutions of numerical problems. The test focuses on all course topics, specifically: WiFi/WiFi Direct, device-to-device networks, car-to-car communications, sensor networks, access control, topology formation and traffic routing. The test typically includes 4 questions, among which there is at least one numerical problem to solve. The remaining questions require the description and the analysis of system aspects. The descriptive questions aim at assessing the students' knowledge on mobile distributed network systems, channel access techniques, topology adaptation, and traffic routing mechanisms, as well as their understanding of protocols and algorithms to be used and configured in specific scenarios. Importantly, the test also aims to evaluate the students' ability to select a technological solution depending on the different practical conditions and applications. The numerical problems aim at verifying the competences acquired by the students on distributed channel access, sensor networks and traffic routing schemes, as well as their ability to correctly configure a network system. Each question is assigned a number of points, which reflects the level of difficulty of the question/problem. The answers to open questions are evaluated considering their correctness, the level of knowledge that the student has acquired on the topic, and the student’s ability to precisely answer the question and to clearly communicate the technical material with accurate terms. The solution of numerical problems is evaluated based on its correctness and technical rigor, on the rational followed by the student and on the student’s ability to apply the acquired know-how. The final mark is computed by summing the marks obtained in each question, with the final mark being 30/30 cum lode; the minimum mark students have to achieve in order to pass the exam is 18/30.

The teaching material consists of copy of the slides e during the course, text of numerical problems, and suggested reading. All the material is available on the web portal of the course. Useful references are as follows: - M. Gast, ed. (2002): "802.11 Wireless Networks: The Definitive Guide," O'Reilly (Networking), ISBN 978-0596001834. - M. Felegyhazi, J.-P. Hubaux, "Game Theory in Wireless Networks: A Tutorial," IEEE Communications Magazine. - C.S. Raghavendra, K.M. Krishna, M. Sivalingam, T. Znati, Wireless Sensor Networks, Kluwer Academic Publisher, 2004.

• Knowledge of the main formal models and specification languages based on extended finite state machines and dataflow networks. • Knowledge of the hardware and software synthesis methods for synchronous languages and dataflow networks. • Knowledge of embedded software performance analysis techniques. • Ability to analyze at a high level the computational and communication requirements of an embedded application. • Ability to select the best specification languages and implementation tools, and to select a hardware/software architecture for an embedded system. • Ability to create a simulation model of an embedded system using a modeling language (e.g. SystemC).

The course is taught in English. This course introduces the main mathematical models and methods used for the synthesis and verification of embedded hardware and software. It assumes a good knowledge of digital hardware design (with VHDL or Verilog) and of software implementation (with C, C++ or Java) for embedded systems, including a basic knowledge of real-time operating systems. It provides the ability to select and use the best tools and methods for hardware/software co-design, as well as simulation and performance analysis. It provides knowledge about the SystemC language, synchronous languages and dataflow networks.

Topics (about 1/2 credit each): • Characteristics of embedded systems, architectures and design flows. • Control-dominated systems and data-dominated systems. • SystemC language: syntax and semantics. Usage examples. • SystemC design at Transaction level (TLM) and Register Transfer Level (RTL). • Extended Finite State machines. Synchronous (Moore and Mealy) and asynchronous composition. • Synchronous languages: StateCharts, Esterel and ECL. Control constructs (emit, await, abort, parallel). Usage examples. • Hardware and software synthesis techniques for Esterel. Interfacing methods with operating systems and peripherals. • Formal property verification (liveness and safety) using synchronous languages. • Dataflow networks: Kahn Process Networks, determinacy and schedulability. Usage examples. • Static scheduling of dataflow networks, minimizing code size or data memory size. • Hardware synthesis of dataflow networks. • Basic real-time scheduling algorithms. Worst-Case Execution Time analysis for software via simulation and formal methods.

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... The final exam is composed of a written and an optional oral part. The written test includes both numerical exercises and multiple choice questions, about the main topics of the course (SystemC, ECL, dataflow networks, worst case execution time analysis), and lasts 1.5-2 hours. Neither books nor notes can be used. The maximum score is 30. Examples of written tests from past years are posted on "portale della didattica". The oral can be requested by the student after seeing the graded written test, lasts for 15-20 minutes, and covers all the course topics, with more focus on theoretical aspects, such as the principles and properties of the dataflow and extended FSM models, and their analysis and synthesis techniques. The final grade is a weighted average of the written and oral exam results, and can be 30 e lode after a very successful oral exam.

Peter Marwedel, “Embedded System Design�, Kluwer Academic Publishers, 2003. Maurizio Tranchero, Luciano Lavagno et al., “Modeling and Optimization of Embedded Systems�, available on “portale della didattica�. Slides used during lessons and laboratory guides, also available on “portale della didattica�.

L'insegnamento fornisce in primo luogo conoscenze sui principali materiali e componenti per l’optoelettronica in modo tale che, a partire dalla conoscenza dei componenti che compongono un sistema optoelettronico, gli studenti siano in grado di progettare semplici sistemi optoelettronici. Conoscenze acquisite: - Saper riconoscere i principi e le strutture per la propagazione guidata della luce (guide ottiche e fibre ottiche) - Saper comparare i diversi materiali semiconduttore per l'optoelettronica e conoscere le differenti applicazioni di ciascuno di essi - Conoscere la struttura, funzionamento, metodi di simulazione e caratterizzazione in laboratorio di diodi emettitori di luce: LED e laser a semiconduttore. - Conoscere la struttura, funzionamento e metodi di simulazione e caratterizzazione di fotorivelatori, celle solari in semiconduttore e modulatori ottici esterni. - Conoscere i principi dei circuiti integrati fotonici, le piattaforme per la fabbrizazione nelle principali fonderie, gli strumenti disponibili per la progettazione Abilità attese: - saper formalizzare semplici modelli fisici di dispositivi optoelettronici e relativa implementazione in Matlab - saper eseguire in laboratorio con utilizzo della strumentazione fotonica (analizzattori di spettro, misuratori di potenza ottica, controllori di corrente e temperatura) semplici caratterizzazioni di componenti optoelettronici - saper riconoscere i principali parametri e prestazioni dei componenti, leggere i data-sheet, pilotare ed interconnettere i vari dispositivi ottici che formano un sistema optoelettronico. Competenze attese: Capacità di comprendere ed interpretare in modo critico la letteratura tecnica e scientifica sull’argomento. Riconoscere le problematiche legata all’utilizzo delle interconnessioni ottiche in sistemi elettronici. Capacità di interfacciarsi con ingegneri optoelettronici e/o tecnologi esperti del settore.

L'insegnamento intende fornire le conoscenze di base nel campo dell’optoelettronica in modo da formare figure di ingegneri elettronici in grado di conoscere i principali dispositivi optoelettronici, utilizzarli e caratterizzarli all'interno di sistemi semplici e di comprendere come le problematiche correlate allo sviluppo delle tecnologie fotoniche impattino sulla progettazione dei sistemi elettronici e fotonici del futuro.

Il programma dell'insegnamento è suddiviso nelle seguenti parti: PARTE A: Confinamento e propagazione della luce nelle guide ottiche (10 ore) - Concetto di guida ottica - Analisi della guida dielettrica planare - Esempi di guide ottiche: fibre ottiche, guide ottiche in semiconduttore per realizzazione della cavità laser, guide ottiche in silicio per circuiti fotonici integrati in silicio - Problematiche di accoppiamento tra guide diverse - Laboratorio sull’analisi numerica di guide ottiche, propagazione in fibra ottica ed utilizzo di guide ottiche per la sensoristica PARTE B: Proprietà ottiche dei semiconduttori e materiali per l’optoelettronica(10 ore) - Interazione del segnale ottico con il materiale semiconduttore: modello classico dell’oscillatore - Emissione stimolata, spontanea ed assorbimento di fotoni - Silicio, Germanio e materiali III/V - Heterostrutture - Calcolo analitico dello spettro di assorbimento e di guadagno di un materiale semiconduttore - Cenni ai materiali a dimensionalità ridotta: Quantum Well, Quantum Wire, Quantum Dot PARTE C: Diodi per la generazione ed amplificazione della luce (15 ore) - LED, laser a semiconduttore presentati attraverso l’approccio fenomenologico delle equazioni di bilancio - Amplificatori ottici a semiconduttore (SOA) e diodi superluminescenti. - Analisi delle caratteristiche statiche e dinamiche dei laser a semiconduttore - Rumore e larghezza di riga - Realizzazione della cavità laser: specchi, strutture a feedback distribuito, laser a cavità esterna accordabili - Packaging - Integrazione del laser a semiconduttore nella piattaforma silicon photonics CMOS compatibile - Laboratorio sulla simulazione e caratterizzazione sperimentale di LED e diodi laser PARTE D ed E: Rivelazione e modulazione del segnale ottico (15 ore) - Fotodiodi e celle solari - Modulatori ottici - Modulatori ottici nella piattaforma silicon photonics - Laboratorio sulla simulazione di modulatori ottici

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa; Elaborato scritto individuale;
Exam: Written test; Optional oral exam; Individual essay;
... CRITERI: I criteri per la valutazione delle conoscenze ed abilità acquisite saranno: - la capacità di rispondere alle domande ed esporre l'argomento richiesto utilizzando il linguaggio tecnico appropriato . - la capacità di modellizzare e descrivere tramite equazioni il comportamento fisico dei dispositivi presentati durante l'insegnamento - la capacità di risolvere semplici problemi di progetto, - la capacità di comprendere la letteratura tecnico-scientifica sugli argomenti trattati nel corso e presentare correttamente ed in modo critico quanto letto. Ulteriori criteri saranno la padronanza nell’utilizzare gli strumenti di simulazione utilizzati in laboratorio, la padronanza nell’utilizzo della strumentazione di laboratorio, la capacità di spiegare e comparare i risultati ottenuti sia nella parte simulativa sia nella parte sperimentale delle esperienze in laboratorio. REGOLE D’ESAME: lo studente può scegliere due diverse modalità per sostenere l’esame: MODALITA’ A: l’esame consta in una prova scritta della durata di due ore. La prova scritta è composta da due gruppi di domande aperte: un gruppo di domande obbligatorio ed un gruppo di domande facoltativo. Gli argomenti obbligatori e gli argomenti facoltativi saranno chiaramente indicati nelle slide delle lezioni. Vengono proposte domande aperte e/o semplici esercizi di progetto come trattati durante il corso. Il superamento del primo gruppo di domande della prova scritta porta ad un punteggio massimo di 27/30. La risposta al gruppo di domande facoltive porta ad un massimo di altri 6 punti aggiuntivi per il raggiungimento di un voto massimo finale pari a 30L/30. Per questa modalità di esame le esercitazioni di laboratorio sono facoltative ma gli argomenti non fanno parte del gruppo facoltativo di domande. Gli studenti che intendono sostenere l'esame secondo questa modalità possono far richiesta al docente per sostenere l'esame in qualsisi appello (anche anticipatamente rispetto all'acquisizione della frequenza). Durante la prova scritta non è permessa la consultazione di alcun tipo di materiale didattico (dispense, libri, esercizi svolti ...). Sarà disponibile un elenco di tutte le possibili domande (comprese le facoltative) che possono essere argomento di esame. MODALITA’ B: lo studente deve aver frequentato obbligatoriamente tutti i 5 laboratori proposti nell'insegnamento e deve aver redatto per ciascuno di essi una relazione scritta da consegnare il giorno dell'esame caricandola nella sezione Elaborati del portale della didattica.. L’esame è orale e verte su domande riguardanti i progetti e/o esperimenti svolti in laboratorio con richiesta di giustificazioni e spiegazioni su quanto riportato nelle relazioni consegnate. Questa prima parte dell'esame orale porta ad un voto massimo pari a 27/30. La seconda parte dell'esame orale richiede la giustificazione teorica e/o dimostrazioni dei concetti riportati nelle relazioni di laboratorio e la risposta a domande sulla parte facoltativa del corso. Gli argomenti facoltativi saranno chiaramente indicati sulle slide del corso. Questa seconda parte, porta al max 6 punti aggiuntivi per il raggiungimento del voto massimo finale pari a 30L/30. Durante la prova d'esame in modalità B è sempre permesso consultare le relazioni di laboratorio consegnate, è necessario portare con sé i codici Matlab sviluppati durante lo svolgimento dei laboratori e potranno essere richiesti dal docente e/o consultati su richiesta dello studente.

Dispense, guida alle esercitazioni di laboratorio e slide delle lezioni sono disponibili sul portale della didattica nella pagina del corso. Testi consigliati: - J.M Liu "Photonic Devices", Cambridge University Press, 2005 - L. Coldren, C. Corzine, Masanovic, “Diode lasers and photonic integrated circuits�, II Edition, Wiley, 2012 - R. Hui, " Introduction to Fiber-Optic Communication", Academic Press 1st Edition, 2019 Su richiesta al docente verrano messi a disposizione i capitoli di libro dati come riferimento durante le lezioni. Verrà fornita una breve guida all'uso di Matlab come supporto alla parte numerico/simulativa svolta nei laboratori

Knowledge and understanding of the concepts of free-space propagation, scattering from stratified dielectrics, optical fields in anisotropic media and dielectric waveguides. Ability to analyze and design basic optical components. Knowledge of Electromagnetic Compatibility (EMC) issues related to signal integrity in high-speed electronics. Ability to assess cross-talk and signal distortions in the design of multi-signal transfer structures.

The course is taught in English. This teaching unit offers an in-depth coverage of coherent optics (photonics). This subject deals with the peculiar properties of laser light and is the basis for technological achievements such as fiber optics communication networks ('broad band access'), deformation or pollution optical sensors or devices used for biological investigations. In particular, both free-space and guided-wave propagation of optical fields are addressed. A number of fundamental optical components are described and the relevant design methods are presented. In addition, the student is exposed to signal-integrity issues of electromagnetic compatibility and quantitative methods are explained to assess such effects in multi-signal transfer structures.

Free space optics (geometrical optics, gaussian beams, mirrors and lenses, diffractive optical elements) (1CFU) Analysis and design of stratified dielectric structures (antireflection coatings, periodic structures and Bragg mirrors) (1CFU) Optical resonators, Fabry-Perot and Mach-Zehnder interferometers (1 CFU). Crystal optics and interaction with external fields (plane waves in anisotropic media, electrooptic, acoustooptic effects) (1 CFU) Guided wave optics (slab waveguides, optical fibers, mode coupling, directional couplers) (2 CFU) Electromagnetic compatibility for high speed electronics (signal integrity, cross talk in multiconductor transmission lines) (2 CFU)

Modalita di esame: Prova orale obbligatoria; Elaborato progettuale individuale;
Exam: Compulsory oral exam; Individual project;
... Oral exam (30-45 minutes) aiming at ascertaining if the expected learning outcomes indicated in section 2 have been reached. The students will run the programs developed in the home-works and will discuss the results on the basis of the theory presented in the course.

Lecture notes made available through the course website ("Portale della didattica"). Other texts for reference are: B. Saleh, M. Teich,"Elements of Photonics", Wiley 1991 K.Iizuka, "Engineering optics", Springer 1987

The most common concepts used in radar systems, such as range, range resolution, Doppler frequency, and coherency are described. The radar range equation, Radar Cross Section (RCS) and radar losses are addressed. RCS formulas for many simple objects as well as complex object RCS are presented. Continuous Wave (CW) radars and pulsed radars are discussed. Resolving range and Doppler ambiguities is also discussed in detail. A review of radar waveforms, including CW, pulsed, Linear Frequency Modulation (LFM), High Range Resolution (HRR) waveforms and stepped frequency waveforms are analyzed. The concept of the matched filter and the radar ambiguity function are introduced. Pulse compression and binary phase codes and frequency codes are discussed. The phenomenology of radar wave propagation including topics like multipath, refraction, diffraction, divergence, and atmospheric attenuation is addressed. The concepts of clutter and Moving Target Indicator (MTI) are also addressed. Synthetic Aperture Radar (SAR) and remote sensing are the subjects of the last part of the course. According to the course evolution we present an overview of radar signal processing. Moreover, the course illustrates the principles of operation, and provides the design criteria for the main microwave passive components used in radar systems. Finally, the course provides an introduction to electromagnetic compatibility, with particular emphasis on signal integrity and radiated interferences. Software simulations and realistic application examples are presented and discussed all along the course.

The word RADAR is an abbreviation for RAdio Detection And Ranging. In general, radar systems use modulated waveforms and directive antennas to transmit electromagnetic energy into a specific volume in space to search for targets or to remote sensing. Targets reflect portions of this energy (echoes) back to the radar. This course is a comprehensive and detailed description and presentation about radar systems analysis and design that can provide the students with hands-on-like experience. The course concentrates on radar fundamentals, principles, and mathematical derivations. It also provides the student with a comprehensive set of tools that can be used for radar analysis and/or radar system design. This course serves as a valuable resource to students in analyzing and understanding the many issues associated with radar systems analysis and design and remote sensing. The course is taught in English.

Radar fundamentals and applications (0.5 CFU) Radar cross sections (0.5 CFU) Radar waveforms analysis (0.5 CFU) Matched filter and the radar ambiguity function (0.5 CFU) Pulse compression (0.5 CFU) Radar wave propagation (0.5 CFU) Clutter and moving target indicator (0.5 CFU) Synthetic aperture radar and remote sensing (1.5 CFU) Radar signal processing (optional) Microwave components, characterization and design techniques: low-pass and band-pass filters, power dividers, directional couplers (2 CFU) Signal integrity: distortions due to cross-talk (0.5 CFU) Radiated emissions and susceptibility (0.5 CFU)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... The exam consists of a written test including 3 exercises (similar to those proposed during the course) to be solved in 2 hours. During the exam it is strictly avoided to have developed exercises, notes or textbooks. The students are expected to assess the learning outcomes through the solution of exercises on the course subjects. The exercises are evaluated both in terms of the solution method and in terms of calculated results. To improve the obtained score from the written test it is possible to hold an oral test (2 questions) that can increase or decrease the written test score. The questions are directed to verify the theoretical and practical understing of the course subjects.

Course Material is available on the web portal: classes slides, exercises and collection of useful formulas. Skolnik, M., Editor in Chief, Radar Handbook, New York, McGraw-Hill, 3rd Ed., 2008 Levanon, N., Radar Principles, Wiley, New York, 1988 Richards, M., Fundamentals of Radar Signal Processing, McGraw-Hill, New York, 2005

Knowledge of methods to assess wanted and unwanted radiation of electromagnetic fields. Knowledge of the main classes of antennas currently in use in relevant wireless systems. Knowledge of basics of radiated susceptibility (EMC). Knowledge and ability to understand regulations and recommendations for exposure to (non-ionizing) electromagnetic radiation. Ability to understand the requirements of antennas in relevant wireless systems. Ability to carry out basic design of some relevant antenna types. Ability to assess EMC issues for some relevant classes of configurations.

The course is taught in English. All wireless systems are based on the radiation and/or reception of electromagnetic waves. The success of wireless connections (cellular networks, WLAN, Bluetooth, etc.) relies on the fact that electromagnetic fields are pervasive; in turn, this also poses a threat to proper operation of all electronic systems, and motivates the need to understand, control and/or mitigate electromagnetic interference, which is a key topic of the electromagnetic compatibility (EMC). This course addresses engineering of electromagnetic field radiation in relevant applications in electronics and communications. This includes intentional radiation and reception of waves, as in antenna theory and design, as well as unwanted radiation and reception of fields (i.e., interference), that is, EMC. Knowledge of antennas is a key competence in communication system design; understanding the limitations imposed by electromagnetic interference is a necessary competence not only in communication systems, but also for any electronic hardware, all the way down to modern integrated circuits design.

Review of radiation of electromagnetic fields (intentional and non-intentional sources); reciprocity and reception/interference (1 CFU); Review of antenna fundamentals, antenna and/or sensors requirements in relevant systems and EMC tests (0,8 CFU); Wire and broadband antennas: biconical antenna, dipoles, Yagi-Uda, loop, log-periodic (1 CFU); Symmetry and balancing; common/differential mode radiation and susceptibility (0,8 CFU); Aperture-type antennas: Horns, Slots, Printed antennas (microstrip), Reflectors (1,8 CFU); Arrays, beam-forming and signal-combining/splitting networks (1,6 CFU); Overview of regulations for EMC, and regulations and recommendation for exposure to electromagnetic fields (0,6 CFU);

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa; Elaborato scritto individuale;
Exam: Written test; Optional oral exam; Individual essay;
... A) The final mark consists of three parts: A.1) written problem-solving test: maximum mark 27/30; Duration: 2-2.5 hour. Type: open-book; any material (notes,books, etc) apart solved exercises can be used. A.2) Submission of completed assignments grants an additive bonus of max. 1/30. A.3) Submission of the laboratory reports gives an additive bonus of max. 2/30. B) Participate to an optional oral exam, mainly based on the theory, requires a minimum mark of 18/30 obtained for the written part (A.1). During the oral exam (approx. 30 min) students are asked to demonstrate their skills on handling the mathematical part (demonstrations), on discussing physical inside (interpretation of the results), and on designing approach (define the type of solution(s) considering input parameters/constrains). In case of the oral exam the final mark is given by the arithmetic mean (average) between the mark obtained at the oral exam and the mark from the previous item A.1. Bonuses are added after.

The learning will be supported by handouts made available by the instructor. A bibliography of useful reference textbooks (not necessary for course activity, only to probe further) will be also made available on the web portal. Some example text-books are reported below: R. E. Collin, “Foundations for microwave engineering�, McGraw-Hill, 1992. D. M. Pozar, “Microwave engineering�, Addison Wesley, 1990. C. R. Paul, "Electromagnetics for engineers", Wiley, 2004. S. Ramo, J. Whinnery and Th. Van Duzer, "Fields and waves in communication electronics", Third edition, John Wiley & Sons, 1994. P. H. Young, Electronic communication Techniques, Prentice Hall, 1991. J.D. Kraus, Antennas,. etc.

Risultati di apprendimento attesi Students who complete this course will acquire the following knowledge: - Classification of industrial robots according to their kinematic configuration - Forward and inverse kinematics of industrial manipulators, in different formulations - Velocity kinematics, Jacobian, kineto-static relationships - Forward and inverse dynamical equations and their characterization and interpretation - Decentralized and inverse-dynamics control of industrial robots - Classification and characterization of mobile and wheeled robots - Wheel characteristics and non-holonomic constraints - Kinematics of wheeled robots, kinematic control - Basic concepts on dead reckoning and path planning - Sensors and computer vision for robotics - Software simulation tools for robotics. Matlab/Simulink and the Robot Operating System (ROS) Students who complete this course will acquire the following abilities: - Analyze a kinematic chain, setting the body reference systems, and write the direct and inverse position kinematic equations - Write the direct and inverse velocity kinematic equations of a given open chain structure; analytical and geometrical Jacobian; kineto-static relations - Write and characterize the dynamical model of simple industrial manipulators using the Lagrange formulation, assessing the relative influence of the different terms in the dynamical equations - Devise independent-joint and inverse-dynamics control architectures, and assess and compare their performance - Write the kinematics of basic wheeled robotics structure - Implement basic kinematic control schemes for mobile robots - Operate a basic selection of onboard sensors, based on their characteristics and technical specifications - Simulate industrial and mobile robot behavior using the software tools studied in the theoretical sections

The course is entirely taught in English. The students who complete this course will gain knowledge on fundamental concepts in robotics, dealing with both industrial and mobile robots. Industrial robots will be studied both from a kinematic and dynamical point of view. Independent-joint and inverse-dynamics control algorithms will be introduced, as well as fundamental algorithms for the generation of reference trajectories. Mobile, wheeled robots will be studied from a kinematic point of view, and algorithms for locomotion control and path planning will be defined and studied. Elements of sensors and computer vision for robotics will complement the knowledge base of this course.

Programma - Course introduction, history of robotics and milestones - Definitions, kinematic chains, degrees of freedom, redundancy, robotics arms classification, robotic wrists classification - Direct kinematic problem, Denavit-Hartenberg convention, inverse kinematic problem - Velocity kinematics, geometrical and analytical Jacobians, statics, kineto-static dual relations - Dynamics equations, structural properties, characteristics, interpretation - Model of the motor-gearbox-arm chain, state variables, nonlinear state variable equations - Trajectory planning, methods for attitude planning, attitude planning. Practical issues, motor constraints, micro-macro interpolation - Control schemes for rigid manipulators: independent joint control and inverse-dynamics control, PD control with gravity compensation, computed torque control, interaction control - Mobile robots, wheel and wheeled robot classifications, non-holonomic constraints - Kinematics of simple wheeled structures: differential drive, unicycle, bicycle, kinematic control - Sensors and computer vision for robotics - Basic elements of dead reckoning and path planning - Simulation tools for robotics: Matlab/Simulink and the Robot Operating System (ROS) - Conclusive remarks and exam simulation

Modalita di esame: Test informatizzato in laboratorio; Prova scritta (in aula); Elaborato progettuale in gruppo;
Exam: Computer lab-based test; Written test; Group project;
... Specific learning outcomes are assessed through the administration of a final written exam. Knowledge items will be assessed through the administration of theoretical exercises and problems concerning the theoretical foundations of robotic systems. Abilities will be assessed through the administration of numerical exercises and problems, as well as through the design, analysis, or modification of software elements, written in the programming languages studied in class. The exam consists of a written test, aimed at assessing the comprehension of the theoretical concepts and the ability to apply them to practical case studies. The test consists of two sections: - the first section comprises 10 to 15 multiple-choice questions; - the second section comprises 3 to 5 problems. Such problems can be open-answer questions, numerical problems, coding problems. Incentives and penalties on the final marks may be given to students, in an amount not greater than the +/-10% (+/-3 pts), based on the active participation to the laboratory activities. Students abroad for study reasons and other particular cases will be evaluated on a case-by-case basis. The exam is closed-books, closed-notes. Students are allowed to take with them a single A4 sheet, compiled on both sides with notes and formulae at their wish. The exam duration is 2 hours. Students who would like to gain more practical insights on the topics covered in the course, may propose to the instructor the realization of a project. A project must be executed by a team of 3 to 5 students. Project topics will have to be agreed upon and approved by the instructor. The project outcomes must be presented to the instructor in the agreed form, generally through either a report or a presentation. Individual contributions must be clearly stated and identifiable. Projects are not mandatory, they do not substitute any part of the written test, and will be evaluated up to an additional 10% of the full marks (3 pts). To pass the exam, students must attain a full sufficient mark (i.e. 18/30) at the written test. This implies that sufficiency cannot be achieved thanks to incentives for laboratory or projects. To attain full grade with honors (lode), students must achieve a total of at least 33/30, including incentives. An additional oral examination may only be requested by the instructor, in order to better assess the student’s preparation.

Handouts, notes, and program codes will be provided during the course. The instructor notes will include solved and unsolved exercises. Textbooks are not mandatory. Selected parts may be useful to understand more in-depth the concepts reported in handouts and notes. 1. B. Siciliano, L. Sciavicco, L. Villani, G. Oriolo, “Robotics: modelling, planning and control�, Springer 2. M.W. Spong, S. Hutchinson, M. Vidyasagar, “Robot Modeling and Control�, Wiley 3. R. Siegwart, I.R. Nourbakhsh, D. Scaramuzza, “Introduction to autonomous mobile robots�, The MIT Press 4. P. Corke, “Robotics, Vision, and Control – Fundamental algorithms in Matlab�, Springer

The course offers the student the possibility to deepen and put in practice the knowledge on physical layer functions of communication systems as well as the signal and image Processing techniques. The lab sessions will be preceded by lectures to describe the experiments that will be performed and the procedure to implement them. The course will provide knowledge of: - the methods for the experimental characterization of optical sources - the methods for the experimental characterization of active and passive optical devices - the methods for the experimental characterization of optical communications systems and subsystems - the architecture of Digital Signal processing (DSP) Systems - the fundamentals on signal and image compression - some algorithms of digital signal processing and their implementation methods The student will acquire the ability to: - characterize optical sources, active and passive optical devices, optical communications systems and subsystems - setup a laboratory experiment in the optical communication field - develop appropriate signal-processing algorithms and implement them on a DSP The ability to apply the gained knowledge will be verified from lab reports, and their discussion.

This is a laboratory and experimental course in the field of signal processing and optical communications. Most of the activity is performed in the laboratories, where students have the opportunity to setup experiments regarding signal analysis on a Digital Signal Processor (DSP) and optical communications. Few introductory lectures are given to introduce the lab experiences. One of the goals of the course is to foster the communication skills and the ability to work in groups.

The course covers three main areas of modern communications systems, and students take classes and laboratories focusing only on two of the two proposed areas: 1. Signal and Image Processing laboratory (3 CFU) 2. Optical Communications laboratory (3 CFU) for a total amount of 6 CFU. Theoretical Lectures: Optical communications (0.5 CFU) • Measures of optical powers, wavelength and corresponding instruments • Measure of optical spectrum and corresponding instruments • Methods for high resolution spectral characterization • Experimental modelling of optical transmission systems and corresponding instrumentation Signal Processing (0.5 CFU) • IReview of FIR and IIR filters • Fixed point implementation • Quantization • Source coding • DSP architecture and development tools Laboratories: Optical communications (2.5 CFU) • Spectral measures of laser sources through the “optical power meter� and the “wavelength meter� • Experimental procedure for the joint of optical fibers and corresponding measurement of the joint attenuation • Experimental characterization of passive optical devices • Realization of an optical amplifier and corresponding experimental characterization • Spectral characterization of optical sources through optical spectrum analyzers and high resolution methods Signal Processing (2.5 CFU) DSP implementation of linear filters and their application to lossless compression: - Program template and in/out template and in/out interfaces - basic FIR and IIR filtering structures - real-time filtering of audio signals - real-time lossless coding of audio signals - validation and testing

Modalita di esame: Prova orale obbligatoria; Elaborato scritto prodotto in gruppo;
Exam: Compulsory oral exam; Group essay;
... In order to verify the acquired laboratory experimental skills the students have to write reports and to discuss them during the oral examination. Students are required to write two reports on the laboratory experiences (one for every lab area). The report organization will be described during the lectures. Both reports have to be delivered 1 week before the exam day. Every lab report will have an independent evaluation (maximum mark 30/30). Each student will be asked to discuss the content of the report during an oral exam. The oral exam is individual, and students will be asked to answer questions about both the practical and the theoretical parts of the course (maximum mark 30/30) The final grade will be the average between the evaluations of the two laboratory reports and the oral examinations. The grading criteria are the following: - appropriate choice and application of the experimental methodology/algorithms - report clearness and completeness. - appropriate use of the technical terms - completeness of the discussion of the obtained experimental results

The teaching material will be made available by the instructors on the course web portal. Description of the lab experiments will be provided, and reference documentation will be made available to students.

The course offers the student the possibility to deepen and put in practice the knowledge on physical layer functions of wireless communication systems as well as the signal and image Processing techniques. The lab sessions will be preceded by lectures to describe the experiments that will be performed and the procedure to implement them. The course will provide knowledge of: - the architecture of Digital Signal processing (DSP) Systems - the fundamentals on signal and image compression - some algorithms of digital signal processing and their implementation methods - structure of Software Defined Radio (SDR) platforms - the methods for wireless communication systems design and prototyping The student will acquire the ability to: - develop appropriate signal-processing algorithms and implement them on a DSP - implement on suitable hardware/software platforms some of the blocks of the studied wireless communication standards The ability to apply the gained knowledge will be verified from lab reports, and their discussion.

This is a laboratory and experimental course in the field of signal processing and wireless communications. Most of the activity is performed in the laboratories, where students can setup experiments regarding signal analysis and wireless transmissions on Digital Signal Processors (DSP) or Universal Software Radio Peripherals (USRPs). Few introductory lectures are given to introduce the lab experiences. One of the goals of the course is to foster the communication skills and the ability to work in groups. Lessons and Labs will be registered and made available for those students that cannot physically attend the course.

This lab course covers two main areas of modern communications systems: 1. Signal and Image Processing laboratory (3 CFU) 2. Wireless transmissions laboratory (3 CFU) for a total amount of 6 CFU. Theoretical Lectures: Signal Processing (0.5 CFU): • Introduction to compression • Decorrelation techniques for signals and images • Quantization • Source coding • DSP architecture and development tools Wireless communications (0.5 CFU): • Overview on the main components of the physical layer of broadband fixed and mobile radio-communication standards • Structure and main functions of conventional and software defined digital radio transceivers • Software defined radio (SDR) platforms Laboratories: Signal Processing (2.5 CFU): DSP implementation of a compression algorithm, including: - Program template and in/out interfaces - predictor - quantizer - lossless source coder - validation and testing Wireless communications (2.5 CFU): • Implementation on SDR platform (Ettus B210 and National Instruments USRP-2901) of some common transceiver blocks suitable for most wireless communication standards (WiFi, LTE, DVB) • Test and measurements of the performance of some implemented receiver algorithms

The teaching material will be made available by the instructors on the course web portal. Description of the lab experiments will be provided, and reference documentation will be made available to students.

L’obiettivo principale dell’insegnamento è quello di fornire all’allievo le conoscenze affinché sia in grado di valutare i problemi di misura connessi all’impiego della strumentazione sia "stand alone" (oscilloscopi digitali, FFT, analizzatori di spettro a conversione eterodina) sia basata su sistemi di misura "PC-based". Parte del corso è dedicata ai sensori di grandezze fisiche con l’intento di affrontare le problematiche metrologiche ad essi associati (sensibilità , incertezza, rumore...). Il raggiungimento degli obiettivi di apprendimento permetterà di sviluppare nell’allievo le conoscenze relative: - ai principi di funzionamento di sensori di grandezze fisiche - agli aspetti principali delle tecniche di interfacciamento dei sensori con i sistemi di misura - alle diverse opzioni tecnologiche di realizzazione dei sensori in funzione delle prestazioni di misura richieste - alle capacità di interpretare le specifiche fornite dai costruttori per i diversi tipi di sensori - al contesto applicativo e i vincoli di progetto di sistemi di misura complessi, con particolare attenzione a quelli a basso rumore; - alle caratteristiche e alle potenzialità della moderna strumentazione (FFT, analizzatore di spettro) per l'analisi del rumore e delle incertezze nelle misure - alla progettazione di un sistema di acquisizione dati basato sull'uso di un PC

Insegnamento obbligatorio per la Laurea Magistrale in Ingegneria Elettronica collocato al 1° periodo didattico del 1° anno. Il corso pone particolare attenzione all'aspetto sperimentale delle misure elettroniche a basso rumore, l’analisi spettrale e l'analisi dei dati. La multisciplinarietà del corso è la sua caratteristica peculiare.

Analizzatori di spettro (AS): componenti a RF per analisi spettrale (mixer e sintetizzatori di frequenza). Analizzatore di spettro ad FFT: schema di massima, modalità di funzionamento, problemi legati alla finestra di acquisizione (leakage, windowing). AS ad eterodina. Analizzatore di spettro a RF con doppia conversione e FFT. Prestazioni e confronti dei principali AS presenti in commercio (1.2 ects). Analisi dei dati sperimentali di misura: grafici di dati sperimentali, best fit lineare e non lineare, varianza classica e tipi di rumore, Allan deviation. (0.8 ects) . Principio di funzionamento e prestazioni di sensori. Principali categorie di sensori per grandezze fisiche (sensori di temperatura, umidità , allungamento, magnetici, posizione, piezoelettrici, ottici, ...) e relativi sistemi di condizionamento del segnale; amplificatore da strumentazione. Determinazione del rapporto S/N in circuiti con amplificatori operazionali per il condizionamento del segnale proveniente da sensori. Noise gain. Tecniche di riduzione del rumore ed analisi del tipo di rumore. Accelerometri MEMS. Lock in amplifier. (1.8 ects). Schede di acquisizione dati: utilizzo di una scheda di acquisizione dati di tipo commerciale, studio dell’architettura, stadi di ingresso, contributi di incertezza, tecniche di programmazione. Sistemi di misura complessi e tecniche di interconnessione: IEEE488, LAN (0.6 ects). Laboratori sperimentali (3.3ects). Descrizione delle esercitazioni sperimentali di laboratorio (0.3 ects).

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

• Introduction to instrumentation and measurements, Robert B. Northrop; Pubblicazione: CRC press; Anno: 2014 (Third edition); Bib. centr. Ingegneria, Collocazione: 124.648 - Esercizi di misure, M. Norgia, A. Pesatori, C. Svelto; Editore: Esculapio; Data di Pubblicazione: 2006; Bib. centr. Ingegneria, Collocazione: 132.219 - Handbook of modern sensors, J. Fraden; Editore: Springer; Data di pubblicazione 2010; Bib. centr. Ingegneria, Collocazione: 134.218 - Analog Devices: https://www.analog.com/en/education/education-library/practical-design-techniques-sensor-signal-conditioning.html - Keithley Instruments: Low level Measurements handbook (disponibile online: https://www.tek.com/document/handbook/data-acquisition-and-control-handbook) - Keithley Instruments: Data acquisition and control handbook (disponibile online: https://www.tek.com/document/handbook/low-level-measurements-handbook Inoltre: - materiale fornito che riguarderà prevalentemente i manuali della strumentazione e la documentazione dei sensori presentati durante le lezioni in aula. - copia delle slides utilizzati durante le lezioni, comprendenti esempi di progettazione e di problemi richiesti in sede di esame.

• Conoscenza della struttura di un sistema di elaborazione generico e di processing element standard (microprocessori, microcontrollori,DSP): CPU, memoria, I/O, rete di interconnessione, alimentazione e temporizzazione. Conoscenza della struttura interna di microprocessori dedicati: DSP, coprocessori, DMA, microprocessori riconfigurabili - Conoscenza e capacita' di progetto di architetture di memorie complesse e eterogenee (Main memory, cache,virtualizzazione della memoria) - Capacita' di analizzare e utilizzare le principali periferiche dei PE: I/O digitale, strategie di buffering, sistemi di temporizzazione, sistemi di comunicazione sincrona/asincrona Capacita' di progettare sistemi basati su PLD ad alte prestazioni acquisendo competenze sull'architettura interna, sul flusso di progetto ottimizzato (potenza, area, velocità ). - Valutazione quantitativa degli effetti legati alle interconnessione a livello fisico e logico: tecnologie, linee di trasmissione, diafonia, cenni di compatibilità elettromagnetica, interfacciamento in sistemi multitensione - Capacita' di valutazione e progetto delle architetture di interconnessione a livello logico - Conoscenza delle problematiche relative alla distribuzione dell'alimentazione ed al monitoraggio della stessa - Abilita' nella gestione e nel progetto delle tecniche di generazione e distribuzione del clock: oscillatori, PLL/DLL/FLL, parametri caratteristici - Abilita- nella gestione delle specifiche e dei vincoli nel progetto di sistemi digitali complessi nonche' sulle scelte algoritmiche (basate sulla complessita' computazionale, la banda di interconnessione e la rappresentazione dei dati/numero di bit) - Capacita' di analisi e di progetto di sistemi a diversi regimi di clock - Abilita' nel progetto del controllo nei sistemi digitali complessi - Conoscenze sulla derivazione dell'unita' di esecuzione sia nelle forme sequenziali che parallele

Il corso e' tenuto in italiano. Insegnamento obbligatorio (in alternativa a Digital Electronics) per la laurea magistrale in Ingegneria Elettronica, collocato al primo periodo didattico del I anno. Questo corso pone l'accento sull'analisi delle architetture dedicate all'elaborazione sia dal punto di vista delle metodologie di derivazione sistemistica sia di integrabilità nelle varie piattaforme. In particolare saranno affrontate le tematiche relative a sistemi integrati di elaborazione ad elevate prestazioni/parallelismo nell'ottica di fornire le conoscenze sistemistiche necessarie al fine di permettere un approfondimento nei corsi opzionali di indirizzo successivi. Queste conoscenze verranno integrate dal completamento dell'analisi delle metodologie di progetto digitale, analizzando sistemi composti da microcontrollori/microprocessori, logiche programmabili, memorie, e interfacce col mondo esterno, ponendo particolare enfasi non tanto sul singolo componente ma sul "sistema": come collegare, interfacciare, programmare e gestire i vari blocchi, e sul 'flusso di progetto¿: quali strumenti e quali metodologie utilizzare. Verranno infine affrontati i problemi legati alle interconnessioni (soprattutto dal punto di vista metodologico), interfaccia tra microprocessori, memorie, logica (con FPGA), I/O, etc...

• Sistemi a microprocessore/microcontrollore/DSP (2 CFU) Struttura di un sistema di elaborazione Processori di uso generale DSP, Co-processori, DMA, Processori riconfigurabili Memorie Dispositivi di I/O - Dispositivi Programmabili (1,5 CFU) Architettura interna Flusso di progetto Ottimizzazione per consumo, area, velocità - Interfacciamento PE/memorie/IO (1,5 CFU) Topologie di interconnessione: Bus, crossbar, etc. Indirizzamento Tecniche di gestione degli errori Esempi di standard ad alto livello - Interconnessioni e integrità dei segnali (2 CFU) Linee di trasmissione Distribuzione dell'alimentazione e dei segnali di temporizzazione Cenni di compatibilità elettromagnetica Interfacciamento in sistemi multi-voltage - Sistemi di elaborazione integrati: derivazione algoritmico/architetturale; elaborazione sequenziale e parallela(1 CFU) Analisi specifiche e vincoli di progetto Flusso di progetto architetturale e mapping tecnologico Analisi dello spazio delle soluzioni e scelta della soluzione ottimale (parallela o sequenziale) - Sistemi di elaborazione integrati: temporizzazione e regimi di clock (1 CFU) Analisi della temporizzazione nei sistemi digitali complessi (memorizzazione dei dati nei flip flop e nei latch) Sistemi di temporizzazione multi-regime: generazione dei clock e sincronizzazione dei dati e dei controlli - Sistemi di elaborazione integrati: unita' di controllo e di esecuzione (1 CFU) Tecniche di sintesi di Macchine a stati complesse e estione dello start-up, del funzionamento corretto e del power-off Sistemi di controllo hardwired e micro programmato Unita' di esecuzione: definizione dei blocchi e spazio delle soluzioni dal punto di vista delle interconnessioni e della capacita' computazionale.

Modalita di esame: Prova orale obbligatoria; Elaborato progettuale in gruppo;
Exam: Compulsory oral exam; Group project;
... L'esame consiste in una prova orale divisa in due parti. Ciascuna parte ha una durata di 15-20 minuti e riguarda tutti gli argomenti trattati a lezione, nei laboratori e nei lavori assegnati, comprese le relazioni svolte. Il voto finale e' una media pesata della valutazione dei due orali. Il candidato deve essere sufficiente in ambedue le parti. L'ammissione alla prova orale e' condizionata dall'avvenuta consegna delle relazioni di laboratorio, svolte in gruppo, che deve avvenire almeno sette giorni prima dell'appello. La valutazione delle relazioni si basera' sulla corretta applicazione della metodologia di progetto presentata in aula, e sulla chiarezza di esposizione di quanto elaborato dai candidati.

I testi che coprono buona parte degli argomenti del corso sono: F.Vahid, T. Givargis, "Embedded System Design: A Unified Hardware/Software Introduction", John Wiley and Sons W. Dally, J. Poulton, " Digital Systems Engineering", Cambridge University Press. Sono disponibili copie dei lucidi utilizzati nelle lezioni, e i manuali per le esercitazioni di laboratorio, corredati delle caratteristiche dei componenti utilizzati. Tutto il materiale didattico e' scaricabile attraverso il portale della didattica.

• Conoscenze delle diverse cause di consumo di potenza nei circuiti elettronici e il loro peso nel budget di energia disponibile - Conoscenze delle diverse tecniche di stima della potenza e dei principali strumenti di valutazione. - Conoscenza delle diverse tecniche di progetto a livello circuitale/architetturale/sistema finalizzate alla riduzione dei consumi - Conoscenza degli strumenti CAD di aiuto alla progettazione a basso consumo dei circuiti elettronici

Insegnamento a scelta per la laurea magistrale in Ingegneria Elettronica, collocato al secondo periodo didattico del anno accademico; il corso puo' essere inserito sia al primo che al secondo anno di frequenza. Il modulo vertera' sulle tecniche di progetto di sistemi elettronici in cui la limitazione del consumo di potenza rappresenta un vincolo fondamentale. Saranno affrontati i metodi di riduzione del consumo dei circuiti a differenti livelli di astrazione, partendo dagli aspetti tecnologici fino a quelli che interessano l'architettura di sistema. Le differenti tecniche saranno applicate ad alcuni casi di studio che saranno trattati nelle esercitazioni e nei laboratori, dove verranno illustrati i principali strumenti CAD di aiuto al progetto.

• Introduzione alle problematiche dei sistemi a basso consumo (motivazioni, evoluzione tecnologica, applicazioni, sistemi wireless) (0,5 CFU) - Cause di consumo nelle principali tecnologie di circuiti elettronici (potenza statica, dinamica) ed evoluzione con la riduzione delle dimensioni dei componenti e delle tensioni di alimentazione. (1 CFU) - Tecniche di progetto a basso consumo a livello logico e circuitale (circuiti combinatori, sequenziali, memorie, interconnessioni, temporizzazioni, distribuzione del clock e della potenza). Metodi e strumenti di ottimizzazione del progetto. (1,5 CFU) - Progetto a livello register-transfer-level: riduzione dei glitch, condivisione delle risorse, sistemi di temporizzazione. (1 CFU) - Progetto a livello comportamentale e di sistema: architetture a basso consumo, pipelining, retiming. (1 CFU) - Tecniche di valutazione e riduzione del consumo del software. (0,5 CFU) - Algoritmi e strumenti CAD per l'analisi del consumo di potenza e per l'ottimizzazione della sintesi (0,2 CFU) - Progetto integrato basato sull'Unified Power Format (0,3 CFU)

Modalita di esame: Prova orale obbligatoria; Elaborato scritto prodotto in gruppo;
Exam: Compulsory oral exam; Group essay;
... L'esame consiste in una una prova orale (con voto in trentesimi) relativa alla verifica delle metodologie di riduzione dei consumi. L'orale ha una durata di 30-40 minuti e riguarda tutti gli argomenti trattati a lezione e nei laboratori. L'obiettivo dell'orale e' accertare non solo le conoscenze specifiche relative alle varie tecniche di ottimizzazione dei consumi nei diversi livelli di progetto (dal livello circuitale a quello architetturale, da quello comportamentale a quello software e di sistema) ma anche il modo con cui tali conoscenze siano utilizzate in casi reali di power management. Le relazioni di laboratori saranno valutate anch'esse in trentesimi e prenderanno in considerazione i risultati dei progetti assegnati, la loro validazione con prove e/o simulazioni e la descrizione del lavoro svolto. Il voto finale (in trentesimi) e' una media pesata della valutazione dell'orale (peso 0,7) e delle relazioni di laboratorio (peso 0,3) e sara' arrotondato all'intero successivo qualora il voto abbia una parte decimale maggiore di 0,7. Il termine di consegna delle relazioni e' solitamente il termine delle lezioni. E' possibile acquisire punti aggiuntivi con lo sviluppo di un progetto relativo a qualcuno dei temi sviluppati a lezione. Il progetto verra' concordato congiuntamente dal docente e dal gruppo di studenti interessati e dovra' essere consegnato entro un tempo stabilito di comune accordo. Nel caso di sviluppo del progetto, esso pesera' per il 50% del voto finale e permettera' di raggiungere, ove sia possibile, la Lode.

Il testo di riferimento che copre una buona parte del corso e': "Low- power CMOS VLSI circuit design", Kaushik Roy, Sharat Prasad, John Wiley and Sons Sono disponibili copie dei lucidi utilizzati nelle lezioni e i manuali per le esercitazioni di laboratorio. Tutto il materiale didattico e' scaricabile attraverso il portale della didattica sul quale saranno anche inserite dispense e materiale aggiuntivo per un proficuo approfondimento dei temi trattati nell'ambito delle lezioni.

• Knowledge of Electronic Design Automation flows with particular emphasis on synthesis and optimization techniques; - Modeling of digital circuits and abstract data structures used in CAD tools; - Knowledge of behavioral- and logic-level synthesis methodologies; - Understanding of the main optimization techniques and their algorithms for different cost functions (Area, Delay, Power consumption) - Practical skills in commercial synthesis tools, industrial deep-submicron CMOS technologies and TCL scripting language

The course is taught in English. This course introduces the basic concepts of synthesis and optimization of CMOS digital circuits.

• Introduction to electronic design automation for digital circuits and basic concepts behind synthesis and optimization (1 credit) - Computer-aided design methods, techniques and algorithms at different levels of abstraction (3 credits): o Synthesis and optimizations algorithms at the behavioral level (Scheduling, Sharing and binding algorithms) o Synthesis and optimizations algorithms at the logic level (Boolean and Algebraic methods) o Technology mapping (Boolean and Structural matching) - Computer-aided design for low-power circuits (2 credits): o Power modeling o Low-power design techniques at behavioral and logic level

Modalita di esame: Prova scritta (in aula); Elaborato progettuale in gruppo;
Exam: Written test; Group project;
... The exam consists of two parts. The first one (70% of the final score) is a written test including both numerical exercises and open-answer questions. The time allowed for the test is 2 hours, closed books; the maximum score for this part is 27 points. The second part (30% of the final score) consists of a group project in which some of the techniques described in the course will be implemented on the EDA framework used during the lab sessions; the maximum score for this project is 3 points. The final score is the sum of the score obtained in the two parts.

Class handouts and additional material will be made available on the course webpage. User guides for lab sessions will be made available as well. Main reference book: G. De Micheli, Synthesis and Optimization of Digital Circuits, McGraw-Hill, 1994.

• Knowledge of the rules for the uncertainty estimation according to the probabilistic approach - Knowledge of the most important issues related to traceability and certification of measuring instruments - Capability of scheduling a quality-assurance program for the measuring instrumentation - Capability of understanding the specifications and operating procedures of the modern digital instrumentation - Knowledge of characteristics and capabilities of spectrum analysers - Knowledge of the working principles of the most commonly used sensors - Capability of analysing sensor specifications and selecting the most suitable conditioning circuitry - Knowledge of the architecture of data-acquisition boards and micro-controller based measuring systems - Knowledge of the most important architectures of complex and distributed measuring systems and industrial buses - Capability of designing a complex measuring systems selecting the most suitable components and interconnection devices

Compulsory subject for the Master of Science in Electronic Engineering (first year, first term). This course is meant to extend the subjects of the electronic measurement of the bachelor course. The theoretical lessons deal with: uncertainty estimation according to the probabilistic approach, quality management of measuring instruments (calibration, traceability, metrological confirmation), analysis of the architecture of data-acquisition boards and micro-controller based boards, distributed measuring systems and industrial buses, sensors and conditioning circuitry, spectrum analysis.

Uncertainty estimation according to the probabilistic approach: terms and definitions, estimation of standard uncertainty and expanded uncertainty, propagation of uncertainty, correlated and uncorrelated measurements, numerical examples (0.9 CFU). International organization of metrology and multi-lateral agreements; national calibration systems; calibration and traceability; quality-assurance programs for measuring instrumentation (1.5 CFU). Analysis and development of measuring systems based on data-acquisition boards and micro-controller based boards (2.0 CFU). Distributed measuring systems and industrial buses (0.9 CFU). Working principles of the most commonly used sensors and related conditioning circuitry (1.5 CFU). Spectrum analysis: analogue and digital techniques (1.2 CFU).

Modalita di esame: Prova scritta (in aula); Elaborato scritto prodotto in gruppo;
Exam: Written test; Group essay;
... The final examination aims to check the expected learning outcomes through a written test (2 hours) made up of two parts. The first part includes one problem related to the design and the uncertainty analysis of a data acquisition system (max score 9), while the second part includes 4 questions or exercises (max score 18). The evaluation is based on the correctness of the results and on the capability of designing the data acquisition system according to the measurement requirements. During the written test, reading books or notes is not allowed, with the exception of a document provided by the teacher that summarizes the rules of uncertainty propagation according to the probabilistic approach. The evaluation of the laboratory reports (max score 6), which are based on the completeness of the information and the correct metrological approach, will be summed to the evaluation of the written test (max score 27), thus obtaining the final grade.

Measurement errors: theory and practice (S. Rabinovich). ISO/IEC Guide 98-3:2008 - Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement. Practical data communications for instrumentation and control (J. Park, S. Mackay, E. Wright) On the web portal: a book on calibration, traceability and metrological confirmation of measuring instruments; a set of transparencies on the course subjects including examples of the final test questions.

Specific ability to design from beginning to end at least one type of antenna to be used in contemporary communication systems, employing antenna theory and computer-based procedures. Knowledge of the main classes of antennas currently in use in relevant wireless systems, for terrestrial and space communications, and for the most recent and/or significant applications. Ability to understand the requirements of antennas in relevant wireless systems; the operation of antennas; the techniques and tools for antenna design. Ability to understand and evaluate performance of commercial antennas and to procure antennas and related components. Ability to learn about antennas not discussed in the course, and especially new developments of antennas in future scenarios.

The course is taught in English. Antennas are an obviously necessary components of any wireless system; present applications, and anticipated future scenarios all call for innovative antennas to meet the challenges of green systems with reduced power consumption, of intelligent transportation systems, high-performance space applications, or pervasive distributed-information and distributed-computing networks and systems, like RFID and Internet of Things. This course will focus on Antenna design for present, future and emerging systems. Experience in designing antennas is important not only to carry out design tasks in a professional environment, but also to procure antennas and related components, as well as to conceive wireless systems as a whole in a multi-disciplinary environment.

Review of prerequisites on radiation and antennas (transmission lines not addressed) 6h Compact and light-weight antennas for mobile terminals, automotive, wireless sensor networks 8h Methods for computer-assisted design: electromagnetic modeling, CAD representation, design labs 10h Array antennas: radiating elements; array design; design of beam-forming network 30h Special topics 6h The material progression will be tailored on the basis of the average background of the audience, with the objective of a successful design lab.

Modalita di esame: Prova scritta (in aula); Elaborato scritto individuale; Elaborato scritto prodotto in gruppo;
Exam: Written test; Individual essay; Group essay;
... Grading can be achieved in two alternative ways. A- Evaluation by grading of submitted assignments. - Requires submission of all assignments, in complete form, by the indicated deadlines. The materials to be submitted include reports on design labs. - Assignments must be carried out individually (unless otherwise stated). Assignment papers will be graded and result in the final grade. - Max score achievable: 30 L (no limitation). Grading criteria will also include difference between papers submitted by different persons; it will also consider discussions during carrying out of the assigned tasks in class. B- Exam in standard form: written test on problem solving; the test will propose problems similar to those assigned during the course, and questions on the lectures (as reported in the provided class material). It may encompass design of radiating elements, array factors, beam-forming networks or parts thereof. The test is closed-book (no material allowed), but useful formulas are provided with exam text (to avoid unnecessary mnemonic efforts); the formulas are taken from the course handouts. Duration: 2.5hrs.

The learning will be supported by handouts made available by the instructor, via the didattica web portal. Other materials, including Matlabâ„¢ scritps, scholarly journal articles and other relevant sources will also be made available. The provided handouts are enough for preparing to the final exam. Bibliographical indications will be given for "probing further".

After completing the course, the student shall demonstrate knowledge and understanding of: ? the advantages of power electronic systems in most of the current energy conversion applications ? the concepts and operating principles of reversible and bidirectional switch-mode converters for motor driving applications ? the figures of merit that drives the design and optimization of the power converters ? the structures of basic two- and four-quadrant DC-DC power converters (half- and full-bridge converters) ? the concept of pulse-width-modulation (PWM) in two- and four-quadrant DC-DC switch-based converters ? the architectures of single-phase and three-phase DC-AC (inverters) power converters ? the synthesis of alternating signals using the most common modulation techniques such as PWM, square-wave modulation, and space-vector modulation ? the operating principles of stepper motors and the architectures of power electronic circuits required to drive them ? the concepts of brushless DC (BLDC) motors and the topologies of their power electronic drives ? the basic notions on piezoelectric actuators and the architectures of power electronic circuits required to drive them ? the static and dynamic characteristics of the state-of-the-art power semiconductor devices such as MOSFETs and IGBTs ? the electromagnetic compatibility (EMC) problems associated with power electronic systems In terms of general abilities or skills, the following areas will be worked upon throughout the course: ? ability to read the data-sheets of commercial power devices extracting useful information to identify the best device to meet certain specifications ? ability to investigate the gate drive circuit requirements for the power devices ? ability to analyze the most common power converter topologies for motor driving applications ? ability to analyze certain advanced topologies of power converters ? ability to analyze signals generated using the most common modulation techniques ? ability to investigate the performance parameters, to analyze DC-DC and inverter circuits and to balance pro and cons of the different kind of architectures ? ability to conduct experiments, to analyze and interpret the results. This capability will be dealt with during the laboratory practical sessions ? ability to work cooperatively in a team by means of the development of mini-projects and laboratory practical sessions ? ability to communicate (in both oral and written form) with the engineering community regarding power electronic system confidently and effectively

The Advanced Electronic Drives course aims to provide engineering students with a knowledge about efficient energy conversion techniques employing power electronic circuits and an understanding of how such power electronic circuits could be employed in driving electrical machines. Throughout the course, a strong emphasis is placed on fundamental principles, design techniques and drive applications for power levels up to about 1kW combining state-of-the-art technologies with conventional technologies and current practices. Students from this course will be expected to gain a good understanding of the electrical and switching characteristics of modern power electronic devices, to appreciate the use of such power devices in modern static power conversion systems, to know fundamental techniques of power conversion circuits in applications such as motor drives and to acquire a detailed understanding of the operation of the basic topology of two- and four-quadrant power converters and inverters. By the end of the semester, students will be able to apply the acquired knowledge about power semiconductor devices to select devices for a range of applications and to select and size high performance gate drive circuits for high speed switching applications, analyze and design switching power processing units to meet the electrical specifications of the motors, to evaluate pro and cons of different pulse-width modulation techniques on the driving performances, to gain awareness of the electromagnetic interference problems associated with power electronic systems and mitigating them by applying solutions based on appropriate analytical models.

1. Introduction to the course (lectures 3 hrs) - definition of electronic drives - bi-directionality of power flow: motor and generator operating modes - quadrant of operation of drives - basic notions and equivalent electric circuit of DC and AC actuators 2. Survey of the state of the art about power semiconductor devices (lectures 4.5 hrs; exercises 6 hrs) - power diodes (PN, PIN) and Schottky diodes - power MOSFETs (Double Diffused MOS) - IGBTs - Data-sheet parameters and gate driver characteristics 3. Power electronic converters for stepper motors (lectures 4.5 hrs; laboratory 6hrs) - Operating principle and classification of stepper motors: variable reluctance, permanent magnets and hybrid. Mechanical and electrical characteristics. Unipolar and bipolar steppers - Power electronic drives for steppers : L/R, R/L drives, asymmetrical bridge 4. The switching power pole as the main building block of any hard-switched power converters (lectures 4.5 hrs ) - resistive, inductive and capacitive loads - the switching pole configuration, the unitary switching function - buck and boost operating mode and the main figures of merit - pulse-width modulator 5. Two-quadrant and four quadrant DC-DC converters (lectures 4.5 hrs; exercises 1.5 hrs) - architecture and operating principles - state of conduction of transistors according to current direction flow - unipolar (three-level) and bipolar (two-level) PWM switching modulations - practical implementation: the half bridge and the full-bridge bridge (H-bridge) - dead time influence, output current ripple calculations 6. Power electronic converters for piezoelectric actuators (lectures 1.5 hrs, exercises 4.5 hrs ) - operating principles and classifications of piezo-actuators - Switch-mode power electronic drives for piezo-actuators. 7. Power electronic converters for brushless DC motors (BLDC) (lectures 6 hrs; laboratory 3hrs ) - operating principles and classifications of BLDC motors. - Switch-mode power electronic drives for BLDC motors. 8. DC-AC power electronic converters: inverters (lectures 10.5 hrs ) - Classification of inverters and performance parameters - Single-phase inverters. Sinusoidal-PWM, over-modulated and square-wave inverters: topologies and output spectrum characteristics - Derivation of voltage-cancellation inverters - Three-phase inverters: Sinusoidal- PWM, over-modulated and square-wave inverters: topologies and output spectrum characteristics. - Third harmonic injection and space-vector modulation techniques

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... The achieved learning outcomes will be assessed by a final examination. This consists of a 30 minutes oral session related to the whole program and to all the subjects discussed during classes, exercises and laboratory. The objective of the examination is to verify the competence of the students to discuss the theory and their ability to analyze practical circuits and systems. Final grade reflects achievement of course goals. A list of mini-project ideas is presented to the students in the first weeks of the course usually consisting on the simulation or design of specific electronic drives. Students can chose one of the listed topics, optionally and on a voluntary basis, in order to have the possibility to get additional marks on the final grade. Students doing the mini-projects should terminate their work by the end of the course by delivering a written report and describing the obtained results in classroom by slide presentation.

The learning material used in the lectures, exercitations and lab is made available through the course website. Students should either download and print the files before the lecture and use the copy to facilitate taking notes. More precisely, the reading materials consisting on the slides projected during classes and the lecture notes covering the topics described in the course will be provided at the beginning of the course. Some more materials like technical papers, data-sheets and application notes will be also delivered to the students. Reference textbooks that cover specific parts discussed during classes or other sources to deepen the understanding of some topics will be suggested during the course.

At the end of the class, the student has acquired - knowledge of the basic cells used in complex analog ICs, - ability to design basic gain stages in order to fulfill a set of specifications - knowledge of technology parameters (fab tolerances and device matching) and their effect of circuit performance - ability to analyze and design continuous-time gain stages like Miller OTAs and Folded Cascode OTAs - ability to analyze and design switched-capacitors gain stages and filters - ability to analyze and design integrated current sources and bias circuits - ability to analyze and design bandgap voltage references

The course is taught in English This course deals with the integration on silicon of analog circuits. CMOS technology features and circuits presented in the previews courses are reviewed, and then suitably modified/enhanced to improve the likelihood to be seamlessly implemented in an integrated circuit. The most popular solutions are first analyzed with a “pencil and paper� approach in class and then fully designed using advanced CAD tools (Cadence) in the labs.

• Basic analog cells - Review on CMOS technology, active and passive device models - fabrication tolerances and device mismatch - Nwell, metal, active, poly and select layers (2 cfu) - Bias circuits. Voltage and current reference - Folded-cascode and Miller operational trasconductance amplifiers (OTAs) - Output stages - Fully differential OTAs. Common mode feedback. (3 cfu) - Discrete-time signal processing fundamentals: sampling and z-transform - Design of digital filters - Switched-capacitor circuits and filters (1 cfu)

Modalita di esame: Prova orale obbligatoria; Elaborato progettuale individuale; Elaborato progettuale in gruppo;
Exam: Compulsory oral exam; Individual project; Group project;
... Oral examination on analysis and design of analog integrated circuits (about 30min). As far the evaluation of the lab activity is concerned, there are two possible paths (student choice). The first one requires that the student submit a report on one of the last two design labs: in this case the final grade is a weighted average of the oral exam (weight 0.8) and lab report (weight 0.2). The second possibility is to present a report on a CAD design of a more complex circuits (prepared alone or within a group of two students – depend in on the project complexity) selected in agreement with the Professor. in this case the final grade is a weighted average of the oral exam (weight 0.2) and the report on the design presented during the oral discussion (weight 0.8). The report in both cases can be submitted just before the exam. Both the oral exam and the lab report aim to determine the level of capability of the student to design and implement a simple analog circuits, like an op-amp or a bandgap reference. In case the student chooses to do an independent project on the design of a more complex circuit, the discussion will focus on the design of the individual blocks and questions will be asked to ascertain that student design choices have been adequate and fully understood. When necessary, during the exam, students will be asked to use cadence virtuoso tools while describing their lab report or their design.

Lectures slides will be available Textbooks to be used as additional reference are: 1. B. Razavi, Design of Analog CMOS Integrated Circuits, Mc GrawHill, 2006 (2nd edition) 2. P. R. Gray, P. J. Hurst, S. H. Lewis, R. G. Meyer, Analysis and Design of Analog Integrated Circuits, Wiley, 2009 (5th edition) 3. T. Carusone, D. Johns, K. Martin, Analog Integrated Circuit Design, Wiley, 2012 (2nd edition) 4. R. J. Baker, CMOS Circuit Design, Layout, and Simulation, Wiley-IEEE Press, 2010 (3rd edition) 5. P. E. Allen, D. R. Holberg, CMOS Analog Circuit Design, Oxford, 2012 (3rd edition) 6. R. J. Baker, CMOS: Mixed-Signal Circuit Design, Wiley-IEEE Press, 2008 (2nd edition)

Students who complete this course will acquire the following knowledge: - Understanding the main components, structures and layouts of automated production plants, as well as of stocking areas and transportation systems. - Understanding the main metrics used to evaluate the performance of production systems, e.g., cycle time, production rate, availability, etc. - Understanding the issues connected to the selection of industrial robots components for applications, such as grippers or robotic cells. - Understanding the structure of most common CNC machines, with the use of CAD-CAM programming and their related G-code simulations. - Understanding the PLC architecture and the main programming techniques for automation applications. - Understanding statistical methods and numerical algorithms to assess the performance of queuing systems. - Understanding the main methods for the numerical solution of the most common production scheduling problems: single machine, parallel machines, flow shop, and job shop. - Understanding methods and algorithms for production planning: resource allocation, assignment, distribution. Students who complete this course will acquire the following abilities: - Acquiring the terminology related to modern production systems. - Assessing the performance indices of production systems, devising strategies identify factors that limit productivity and designing method for performance improvement and optimization. - Analyzing the performance of robot components for applications, such as grippers or robotic cells. - Interpreting and modifying machining codes for CNC machines, using simple CAD-CAM software tools to design workpiece machining. - Designing and implementing simple programs for PLCs, able to tackle real-world applications. - Modeling sections of production systems through queueing systems, assessing their performance, and identifying bottlenecks and margins for performance improvement. - Modeling scheduling problems for different production systems, and solving them, finding optimal or suboptimal solutions, through heuristic or linear programming approaches.

The course is entirely taught in English The students who complete this course will gain knowledge on fundamental concepts in modeling, control, and optimization of industrial production systems. Several components of actual production systems will be analyzed, and software tools for their modeling, control, and optimization, will be introduced. At the end of this course, students will gain knowledge on the role and working principles of the main components of modern production systems, as well as on the factors that determine their performance. Students will also be able to identify key issues in modeling and optimization of such systems, as well as to use software tools for modeling, simulation, and optimization. Each theoretical section will be complemented by laboratory experiences to elucidate practical issues and let students familiarize with software tools for modeling, control, and optimization of the systems under exam.

• Overview of manufacturing systems, manufacturing operations, manufacturing metrics and economics. - CNC Machines overview, introduction to programming with G-codes. Use of CAD-CAM based simulators for the generation of the G-codes. - Complementary topics in robotics for industry; e.g., selection of grippers, performance assessment of robotic cells, use of simulation tools to simulate robots (e.g., the Matlab Robotics Toolbox by Peter Corke). - Overview of material handling components. - Simulation of industrial production systems and their control in real time with PLCs. - Queuing theory applied to detect accumulation and bottleneck nodes of a production plant. Algorithms and statistical methods for reliability evaluation and quality control monitoring of production lots. - The main scheduling problems of automated production systems: single machine, parallel machines, flow shop and job shop. Solutions obtained by known rules when applicable or, in general, by numerical algorithms. - Methods and algorithms for production planning: resource allocation, assignment and distribution. - Conclusive remarks and exam simulation

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

Handouts, notes, and program codes will be provided during the course. The instructor notes will include solved and unsolved exercises. Textbooks are not mandatory. Selected parts may be useful to understand more in-depth the concepts reported in handouts and notes. Texbooks 1. M.P. Groover, “Automation, Production Systems, and Computer-Integrated Manufacturing�, Pearson 2. H. Jack, “Automating Manufacturing Systems with PLCs�, free download at http://claymore.engineer.gvsu.edu/~jackh/books.html 3. P. Monkman et al., “Robot Grippers�, Wiley 4. C.G. Cassandras, S. Lafortune, “Indtroduction to Discrete Event Systems�, Springer 5. M.L. Pinedo, “Scheduling – Theory, Algorithms, and Systems�, Springer

Knowledge of the semiclassical models derived from Boltzmann transport equation for the physics-based simulation of semiconductor devices, of their different application domains, and of the numerical techniques involved in their implementation. Knowledge of the quantum transport models based on the non-equilibrium Green?s function (NEGF) formalism. Ability to implement a one-dimensional (1D) solver based on the finite-element method (FEM) for Poisson?s equation in semiconductor devices. Ability to use commercial CAD programs for the physics-based simulation of semiconductor (opto)electronic devices. Ability to implement a 1D FEM quantum transport simulation code based on NEGF.

Aim of the course is to discuss the techniques used for the numerical simulation of semiconductor materials and devices, and to teach the student both to use proficiently a commercial CAD suite and to write specialized device simulation codes - critical competences for engineers expert in (opto)electronic devices and nanotechnologies. The course presents the derivation, implementation and limitations of the most important semiclassical models of electron transport in semiconductors (drift-diffusion, energy balance, hydrodynamic), and provides an introduction to quantum transport models. Particular emphasis is placed on numerical laboratories.

1. Semiclassical models for carrier transport in semiconductors: from the Boltzmann transport equation (BTE) to the hydrodynamic, energy-transport and drift-diffusion models. Numerical issues and fundamental limitations in the simulation of (opto)electronic devices with semiclassical models based on systems of partial differential equations (1 ECTS) 2. Simulation of semiconductor devices at equilibrium: implementation of a 1D FEM solver for Poisson?s equation (1 ECTS) 3. Physics-based semiclassical simulation of (opto)electronic devices with commercial CAD suites (1.5 ECTS) 4. Introduction to quantum transport models. The NEGF formalism. Implementation of a 1D FEM quantum transport simulation code based on NEGF (2.5 ECTS)

Modalita di esame: Prova orale obbligatoria;
Exam: Compulsory oral exam;
... The individual oral examination (30 minutes) is focused on the reports of the numerical laboratories. The final grading takes into account the quality of the lab reports and the ability of the student to discuss the issues involved in each laboratory and her/his personal approach and contribution.

Detailed week-by-week syllabus, lecture notes, and laboratory/homework assignments will be posted on the course website. Supplementary texts include: D. Vasileska, S. M. Goodnick, and G. Klimeck, "Computational Electronics. Semiclassical and Quantum Device Modeling and Simulation", CRC Press 2010. M. Fischetti and W. G. Vandenberghe, "Advanced Physics of Electron Transport in Semiconductors and Nanostructures", Springer 2016.

• Knowledge of cloud computing and virtualization (computing, memory and network) - Knowledge of the theory of Clos topologies for data centers - Knowledge of different virtualization techniques (virtual machines, containers) - Knowledge of probabilistic data structures for fast packet processing - Knowledge of P4 abstraction for fast packet processing - Ability to design the interconnection network of a data center - Ability to design a software to compute the total number of devices in a data center - Ability to experiment Docker containers and configure the networking layer - Ability to design the power distribution network in a large data center - Ability to run an AI application on hardware accelerators

Data centers are the computing infrastructure supporting cloud computing applications. The class is focused on understanding the cloud computing approach and how the data centers are designed. The course focuses on cloud computing and on the different technologies for virtualization, from virtual machines to containers. Furthermore, it focuses also on the design of the data center, in particular on the computing resources, the interconnection infrastructure and the power management. State-of-the-art architectures for the design of large data centers will be considered, based on Clos topologies. Finally, the hardware architectures for advanced computing will be presented, highlighting the role of accelerators for practical relevant applications, as Artificial Intelligence (AI). A practical approach will be adopted, with virtual laboratories on containers, on data center design and on hardware acceleration. The involved professors are experts in computer networks and in electronic design, providing a complementary view of all the main technological issues involved in the design of data centers.

The class is divided in two parts, the first (Part A) on cloud computing and design of data centers (4CFU) and the second (Part B) on digital architectures and advanced computing architectures (2CFU). Lectures topics and corresponding credits: A.1 Cloud computing (2CFU) - Service models. Web services. - Virtual machines and containers. Docker engine and container networking - Lab on Docker engine and networking A.2 Design of data centers (2CFU) - Clos-based design of data centers. Recursive construction - Optical interconnections and switching - Lab on data center design - Software Defined Networking (SDN) and programmable data planes. P4 switches. - Traffic monitoring. Probabilistic data structures (hash tables, bloom filters, sketches) - Lab on probabilistic data structures B.1 Basic digital hardware architectures (0.68CFU) - Von Neumann architectures and fundamental components of a computing system - CPU/GPU architectures, pipelining and parallel processing, power consumption model and voltage scaling - Types of memories: static/dynamic/non-volatile - High-speed buses and transmission lines: the PCIexpress case - Power supply and power management in high-power data centers - Lab on practical optimization of a PCIexpress bus in a GPU-based server

Modalita di esame: Prova orale obbligatoria; Elaborato scritto individuale;
Exam: Compulsory oral exam; Individual essay;
... The final evaluation is based on the oral discussion on the delivered reports. The report will be evaluated based on correctness, original contribution and quality of presentation. The oral will be aimed at discussing the reports and at assessing the level of understanding of the theoretical topics covered in the class. Let GA be the grade of the oral of Part A and let GB be the grade of the oral of Part B, the final grade G of the exam will be computed based on the credit-weighted average of the two parts as follows: G=nearest-integer(4/6*GA+2/6*GB) Both GA and GB must be >=18 to be considered valid.

The teaching material (handouts and reference scientific papers) will be made available by the class teachers on the Politecnico courses web portal and is sufficient to cover all the topics taught in the class.

Ability to read a project described in UML or any other modeling or object-oriented language. Ability to read and navigate use case, class, sequence and requirement diagrams. Ability to design a complex system through interaction of hardware, software, analog or electromechanical objects. Ability to describe the functions, parameters and data of a subsystem of any kind through class parameters, attributes and methods. Ability to translate methods into specific encoding like C, VHDL, SPICE, CodeSimulink, SystemC. Ability to partition a complex hybrid system, describe all its parts, verify correct mutual interactions. Ability to document specifications, requirements, implementation and testing of an electronic or electromechanical complex.

The course is included in the Master of Science in Electrical Engineering and wants to give students the ability to co-design an embedded system consisting of hardware, software and electromechanical subsystems closely interacting, through an object-oriented design approach, focusing on functional description languages (examples given in UML). The course will provide students the necessary knowledge to effectively design a complete system, including electronic parts (electric schematics, design, simulation, optimization, PCB design), programmable logic (behavioral VHDL), software blocks (software design, encoding in C/C++, simulation, testing, integration), electromechanical parts (sensors, actuators, case, mutual interaction with electronic and SW parts) and all the relevant documentation (specifications, design, user, testing, certifications and disposal documentations).

Preliminary Concepts: (1 CFU) Introduction to the course, the definition of embedded system, its characteristics (efficiency, responsiveness, reliability). Hybrid systems: partitioning, HW / SW / analog. Use cases, actors, objects and classes, services and methods, static and dynamic parameters, sequence and collaboration diagrams. A car power window project: definition of objects and external interfaces, features, frequency, resolution, response time Specifications and Partitioning (1CFU) Writing and analyzing specifications of complex systems. Partitioning and interfaces. Analyses of compatibility, sufficiency and necessity of subsystems. Testing and verification. A car power window project: partitioning; definition and specification of interfaces; assignment of tasks to team members. Interfacing: (0.5CFU) Designing I/O interfaces; selection of components and documentation; simulations; compliance (typical and worst cases) Interfaces HW / SW: essential features, conversion between time-continuous and discrete-time, memory map HW Implementation (1CFU) Designing schematics, simulation and PCB design State automata (1CFU) Definition of states and transitions; activities; events and guards. C and VHDL implementations. Car Power windows project: design of state automaton and implementation in C. SW implementation (0.5CFU) Writing SW drivers in C for microcontroller peripherals; writing code for operations; template classes and parameters; instance and classifier attributes. Integration and testing of case study (0.5CFU) Assembly of the PCB designed; testing; integration with SW; final testing Documentation (0.5CFU) Report generation

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

Lecture notes available on the portal. Videorecording of lessons and didactical material in UML available on the portal and on the UML server. Any textbook on UML; e.g. “UML Distilled: A Brief Guide to the Standard Object Modeling Language (3rd Edition)�, Martin Fowler, ISBN 978-0321193681 Documentation of Visual Paradigm tools available on the WEB (http://www.visual-paradigm.com/) IAR documentation on tool available on Web (http://www.iar.com/website1/1.0.1.0/3/1/) The students, divided in groups will receive and keep for the whole course duration an MSP430 development board from Texas Instruments.

At the end of this course, the students know the key characteristics of the considered communication systems, the most advanced techniques used for wireless and wired systems, and the practical scenarios and applications where they are used. In particular, they have an in-depth knowledge of the physical layer constituent blocks of: OFDM-based systems, 4G-LTE and 5G-New Radio systems. This way, the students acquire the ability to contribute to the design and the management of these state-of-the-art telecom systems.

The course is taught in English. This course introduces the most important state-of-the-art techniques used in modern wireless and wired communication systems. The focus is on the system physical layer of mobile networks, from digital modulation to beamforming. The key techniques of 4G and upcoming 5G are analyzed with the aim of understanding their impact on different applications, and their possible evolution. This course is useful for all students interested to digital transmission, both in the Communications and Computer Networks Engineering Degree and in the Electronic Engineering Degree.

Main topics of the course: - Review of wireless systems: Digital modulations (PSK, QAM), coding, multiple access schemes, channel models (10 h) - OFDM and modern techniques for wireless and wired systems (20 h) - 4G LTE mobile networks: physical layer (10 h) - New 5G systems physical layer: requirements, applications and technical solutions from modulation to MIMO and beamforming (20 h)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa; Elaborato scritto prodotto in gruppo;
Exam: Written test; Optional oral exam; Group essay;
... Written exam on course¿s topics (usually two hours and six questions, no books, no notes, highest mark = 30 cum laude). The assessment is made of six questions randomly extracted from a list prepared at the end of the course. Questions reflect key understanding the students should possess on the studied systems, the constituent blocks of their physical layer, and their most important applications.

Teacher¿s material, available on the course web portal. Suggested books: Proakis-Salehi ¿Communication Systems Engineering¿, Sesia-Toufik-Baker ¿LTE, The UMTS Long Term Evolution: From Theory to Practice¿, Erik Dahlman, Stefan Parkvall, Johan Sk¿ld, ¿5G NR The next generation wireless access technology¿ Presentations offered by Telecom companies.

The course enables students to acquire the knowledge and ability to apply basic and advanced design techniques for embedded electronic systems. They will be able to investigate every side of board-level design, starting with the basics of design trends, rules, signal integrity up to the project documentation. At the end of the teaching module the student will get the following competencies and abilities: - Knowledge of the problems related to embedded electronic systems design from specifications to implementation through the simulation of their behavior - Ability to describe the project (requirements, documentation, manuals) - Knowledge of international standards and rules ( EMC, user interface, reliability) - Knowledge of technologies, design flow, design rules for Printed Circuit Boards , and ability to use related CAD tools; - Knowledge of material properties, packaging, component placement, thermal effects, and ability to develop design taking into account these issues. - Knowledge of applied EMC/EMI and ability to consider them in the design; - Knowledge of basic concepts of manufacturing aspects (ergonomy, quality, certification)

The course is taught in English. This class is intended to introduce students to the design and analysis of embedded electronics systems that interact with physical processes. Applications include medical devices, consumer electronics, automotive systems, process controls, manufacturing . A major theme of this course will be the skill to design an electronic system, starting from the technical specifications through the circuit analysis up to the final printed circuit board design. Testing procedures and failure analysis will be also described. A professional Electronic Development Aids (Cadence/Allegro) will be used to design the circuit, to simulate it and to verify its behaviour. Signal integrity aspects will be also evaluated. A case study will be used from the design up to the hardware testing in a final laboratory. Each student will also develop and discuss a homework selected at the beginning of the semester. A final technical report will describe each aspect of the project. The PCB, organised using Gerber files will be submitted to a professional manufacturer (Eurocircuit) to be checked and, in some cases, implemented.

1. Embedded electronic system design fundamentals (1 CFU) a. Design specifications: Y chart, guide lines, international standard and rules b. Design requirements (documentation, release history, testing, maintenance) c. Quality basic concepts d. Ergonomy 2. EDA tools for design, (1,4 CFU) a. Design flow b. simulation, verification and layout c. PCB 3. Electronic components selection (0,8 CFU) a. technologies roadmap b. Packages and related problems c. Interconnections (protocols, connectors, components) 4. Ground and power distribution (0,8 CFU) a. Power Delivery b. Simultaneous Switching Noise c. Power and Ground routing, bypass capacitors 5. Digital Timing Analysis, Common-Clock Timing, Source Synchronous Timing (0,8 CFU) 6. EMI (1,2 CFU) a. Radiated Emissions Compliance and System Noise Minimization, b. Additional PCB Design Criteria, Package Considerations, c. High Speed Digital circuits (Measurement Techniques, Time-Domain Reflectometry, Propagation Velocity)

Modalita di esame: Prova scritta (in aula); Elaborato progettuale individuale; Elaborato progettuale in gruppo;
Exam: Written test; Individual project; Group project;
... The exam's goal is to verify the skill of the students to develop the project of an embedded electronic system. Theoretical issues will be checked by means of a final written test. Practical skills will be checked by means of individual or group (maximum 2 students) personal projects or team (thesis) projects. The final exam is organised with the following rules: 1) a brief (30 minutes) written theoretical section where 7 questions with closed answer with the weight of 0.47 (14/30) on the final score; minimum 4/7 answers should be right. No text (books, notes and so on) will be allowed during the test. 2) a 120 minutes written practical exam on the whole subjects (classes and practises) with the weight of 0.34 (10/30) on the final score; notes and books are allowed. A project will be proposed and each student has to use the CAD tools to produce the whole project (schematic, DRC, BOM, Netlist, Gerber files, technical report) ; 3) alternative to 2). An optional individual (or group, maximum 2 students) electronic project (assigned at the beginning of the semester) will be presented and evaluated with the weight of 0.5 on the final score (maximum 15/30). After 2 months (before XMAS vacations) each group will present 4 items: power point presentation, technical report, project schematic with BOM, Gerber files validated by a manufacturer. If approved the groups will receive comments, suggestions and temporary evaluations immediately after the XMAS vacations. They will have time up to the end of the course (January 20) to apply the required changes. If not approved they will leave the project and will attend the regular exam, part 2). 4) alternative to 2 and 3. Selected projects (teams, thesis) will be implemented and checked in the laboratory by the students (optional, maximum 19/30). If not approved they will leave the project and will attend the regular exam, part 2).

A set of transparencies on the course subjects and exercises Selected articles, datasheets, reports, application notes A list of http links containing instrument manuals and white papers on the different subjects ORCAD tutorial handbook. The main book used is - Kraig Mitzner, Bob Doe et al., "Complete PCB design using ORCAD capture and PCB editor", II edition, Elsevier Academic Press, 2019 a limited number of books will be available free of charge for students Additional (optional) books are: - CADENCE "Orcad CIS User guide, 2016. Avaliable free of charge for every students - Cadence Allegro and OrCAD (Including EDM): What’s New in Release 17.2-2016 Avaliable free of charge for every students - Howard Johnson and Martin Graham "High Speed Signal Propagation", ed. Prentice Hall (Pearson Italy) - Tom Granberg "Digital Techniques for High Speed Design", ed. Prentice Hall (Pearson Italy)

Knowledge of elements of crystal structure. Knowledge of alternative approaches to the theoretical determination of the energy bands in semiconductors. Knowledge of scattering mechanisms in semiclassical theory of charge transport. Knowledge of the electronic and transport properties of polymeric and organic materials. Ability to use the empirical pseudopotential method to compute the electronic structure of crystalline semiconductors. Ability to solve the Boltzmann transport equation by means of a Monte Carlo particle-based approach. Ability to understand and analyze/design polymeric and organic (opto)electronic devices.

Aim of the course is to present the theoretical foundations of electronic properties of materials, including polymeric and organic semiconductors, with particular emphasis on applications in the area of ICTs. This course plays a critical role in the development of an Engineer expert in Nanotechnologies, because it provides the elements for understanding the properties of semiconductors - both bulk and nanostructured - and prepares students for courses in quantum electronics.

Review of the crystal, electronic and transport properties of semiconductor materials and their alloys and heterostructures. Introduction to the empirical and ab initio approaches to the computation of the electronic structure of semiconductors. Details on the use of the empirical pseudopotential method for the approximation of the electronic structure of crystalline semiconductors (1.5 ECTS) Scattering theory: impurity scattering, carrier-phonon scattering, impact ionization scattering, radiative processes. Carrier transport in semiconductors, the Boltzmann transport equation, particle-based device simulation methods, the Monte Carlo approach (3 ECTS) Electronic properties of amorphous and crystalline polymers, conjugated polymers, organic conductors and semiconductors. Transport properties of organic semiconductors. Introduction to organic and polymeric based electronic devices. Inkjet printing technology of polymers (1.5 ECTS).

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria;
Exam: Written test; Compulsory oral exam;
... The exam includes a written test focused on organic semiconductors in the form of four open questions, and an oral discussion about the electronic structure and transport properties of crystalline semiconductors, based on the reports of the numerical laboratories that have to be submitted by the students during the course. The written test is closed-book (no use of any course material is allowed) and has a duration of 90 minutes; the objective of the oral test is to assess the capability of the student to explain the numerical results obtained with the empirical pseudopotential method and the analytic-band Monte Carlo code developed in the laboratories. Percentage-type breakdown of the course grades: completeness/correctness of the written test (20%), quality of the lab reports (40%), ability of the student to discuss her/his approach to the numerical laboratories during the oral discussion (40%).

Detailed week-by-week syllabus, lecture notes, and laboratory/homework assignments will be posted on the course website. Supplementary texts include: M. Fischetti and W. G. Vandenberghe, Advanced Physics of Electron Transport in Semiconductors and Nanostructures, Springer 2016. C. Jacoboni and P. Lugli, The Monte Carlo Method for Semiconductor Device Simulation, ser. Computational Microelectronics, Springer 1989. D. Vasileska, S. M. Goodnick, and G. Klimeck, Computational Electronics. Semiclassical and Quantum Device Modeling and Simulation, CRC Press 2010. Ioannis Kymissis, Organic Field Effect Transistors: Theory, Fabrication and Characterization, Springer 2009.

Knowledge and understanding of the concepts of free-space propagation, scattering from stratified dielectrics, optical fields in anisotropic media and dielectric waveguides. Ability to analyze and design basic optical components. Knowledge of Electromagnetic Compatibility (EMC) issues related to signal integrity in high-speed electronics. Ability to assess cross-talk and signal distortions in the design of multi-signal transfer structures.

The course is taught in English. This teaching unit offers an in-depth coverage of coherent optics (photonics). This subject deals with the peculiar properties of laser light and is the basis for technological achievements such as fiber optics communication networks ('broad band access'), deformation or pollution optical sensors or devices used for biological investigations. In particular, both free-space and guided-wave propagation of optical fields are addressed. A number of fundamental optical components are described and the relevant design methods are presented. In addition, the student is exposed to signal-integrity issues of electromagnetic compatibility and quantitative methods are explained to assess such effects in multi-signal transfer structures.

Free space optics (geometrical optics, gaussian beams, mirrors and lenses, diffractive optical elements) (1CFU) Analysis and design of stratified dielectric structures (antireflection coatings, periodic structures and Bragg mirrors) (1CFU) Optical resonators, Fabry-Perot and Mach-Zehnder interferometers (1 CFU). Crystal optics and interaction with external fields (plane waves in anisotropic media, electrooptic, acoustooptic effects) (1 CFU) Guided wave optics (slab waveguides, optical fibers, mode coupling, directional couplers) (2 CFU) Electromagnetic compatibility for high speed electronics (signal integrity, cross talk in multiconductor transmission lines) (2 CFU)

Modalita di esame: Prova orale obbligatoria; Elaborato progettuale individuale;
Exam: Compulsory oral exam; Individual project;
... Oral exam (30-45 minutes) aiming at ascertaining if the expected learning outcomes indicated in section 2 have been reached. The students will run the programs developed in the home-works and will discuss the results on the basis of the theory presented in the course.

Lecture notes made available through the course website ("Portale della didattica"). Other texts for reference are: B. Saleh, M. Teich,"Elements of Photonics", Wiley 1991 K.Iizuka, "Engineering optics", Springer 1987

Knowledge of high abstraction level design methodologies for digital integrated systems Knowledge of microprocessor architectures Knowledge of design tools based on HDL languages (VHDL, Verilog, System C) Knowledge and ability in the design of basic blocks used in integrated processing architectures, such as arithmetic circuits, memory architectures, interfaces, and interconnections Capability of designing a digital integrated circuit, from initial specifications down to post-layout verification Capability of reading and learning from a scientific paper Capability of writing a technical design report

The course is taught in English. The course is part of the Msc-level programme in Electronic Engineering, offered in the first period of the second year. In particular, it completes the education of students with interest in the design of digital circuits and systems. The main objective of the course is providing techniques for the design of advanced digital processing architectures. Both programmable systems, such as modern microprocessors, and fully dedicated or application specific designs (ASIC) are considered. Among programmable systems, this course mainly superscalar and instruction level parallel (ILP) microprocessors. Design methodologies are provided to develop and optimize application specific architectures, starting from the initial specifications and arriving to the complete layout of the circuit. The main design issues for arithmetic circuits and on-chip interconnect are also studied. A very important role in the course is played by laboratory activities, which are based on the use of advanced design tools for integrated circuits.

The course includes four main topics: 1. Methods for algorithm to architecture mapping (1.5 CFU) These methods (e.g. pipelining, retiming, folding, unfolding) are based on graph representation of algorithm and enable the exploration of alternative implementation architectures, with different cost and performance. Digital filters are used as driving examples. 2. Microprocessor architectures (2 CFU) Review of pipelined architectures (MIPS); A quantitative and qualitative study of superpipelined, superscalar, dataflow, and VLIW processors; Available parallelism in programs; Out of order instruction execution; Reservation stations; Reorder buffers; Branch prediction techniques; Performance evaluation; Multicore processors; Customizable processors. 3. Design of arithmetic circuits (1.5 CFU) Adders, Multipliers, Hardware division, Square root 4. On-chip interconnects (1 CFU) Bus basics, Examples of on-chip busses, Networks-on-Chip (NoC)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa; Elaborato progettuale in gruppo;
Exam: Written test; Optional oral exam; Group project;
... The final grade is formed from two components: 1. Evaluation of the written test (80%), up to 24 points 2. Project evaluation plus short oral colloquium related to the submitted projects (20%), up to 6 points After the written test, students can ask for an optional oral exam focused on the topics covered by lectures. This oral exam may change the first mark by plus/minus 3 points. The written test includes one or two brief design problems, as well as two or three open answer questions on the topics covered by lectures. Normally, the same weight is assigned to each question in the test; however, the weight of questions with very low average results can be slightly reduced. Available time is two hours. Use of books or notes is not admitted. Projects are evaluated based on the following criteria: - completeness of the design - adopted methodology - achieved results. The oral colloquium aims at clarifying design choices and other details of the submitted project; moreover, it is used the verify that every component of the team actually contributed to the design.

The learning material used for both lectures and laboratory sessions is made available through the course website: this material includes notes provided by teachers, slides, scientific papers and book chapters. Reference books that cover part of the course content are: David A. Patterson, John L. Hennessy, Computer Organization and Design RISC-V Edition,Morgan Kaufmann , 2017 K.K. Parhi, VLSI Digital Signal ProcessingSystems: Design and Implementation, John Wiley, 1999

-Classification of the most relevant CMOS fabrication processes in accordance to ITRS roadmap and their evaluation in terms of figures of merit (Ion, Ioff, intrinsic time....) -Evaluation of consequences due to the scaling techniques used in integration processes both on the single devices and on the inteconnects among structures. -Knowledge of the main fabrication technologies for nanometer scale devices: advanced gate and channel technologies. -Knowledge of adavanced CMOS processes as SOI, Double gate, FinFET, GAA. -Knowlege of the inteconnections and packaging technologies and evaluation of their electrical behavior in term of delays, crosstlak, IR drop. -Ability of using simulation tools for the estimation of the consequences on device and system of the technological parameters. -Knowledge of the emerging technologies that can be considered a possible replacement of CMOS processes.

The course are taught in English. The subject is offered in the study tracks of Electronic Engineering Master where the technological knowledge of the integration processes is need, the subject is also compulsary in the study plan for Nanotechnologie for ICTs Master. The subject is offered during the first semester of the second year and is focused on the technological aspects of system integration with attention to micro and nano technologies currently available to the designers.

-Classification of the most used CMOS fabrication processes (HP High performance,LOP Low Operating Power, LSTP Low Stand By Power) -Technological scaling: analysis of the consequences at device level, at interconnects level and at system level. -Advanced CMOS processes: gate structures. -Advanced CMOS processes: channel and source drain structures. -FinFET and GAA technology. -Evaluation of the technological choices on the system level performance: frequency, dynamic power, static power. -Interconnects techniques: damascene, dual damascene, planarization and low-k dielectrics. -Packaging technologies. -Emerging technologies: fabrication of nano wires. -Emerging Tecnologies: 3D integration.

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria;
Exam: Written test; Compulsory oral exam;
... The exam is organized: 1)a brief (40 minutes) closed book written section where 7 questions with open answer (max. 100 words) will enable the student to go on the exam if at least 4/7 answers will be right; this section does not contribute to the final score; 2)a 30 minutes oral exam on the whole subjects (classes and practises) with the weight of 0.6 on the final score will be evaluated in /30; 3)a project work (assigned during the semester) will be presented and evaluated in /30 with a weight of 0.4.

The main manual book used is the ITRS roadmap in web published version on http://www.itrs2.net. The most used sections are: Process Integration Devices and Structures; Interconnects; Assembly; Emerging Research Devices. Slides of lecture and some related scientific papers for insights are available on web pages of the subject.

The student has to develop knowledge that extends and/or reinforces the one from preparatory courses and allows developing/applying original ideas and methods to the design of nanocircuits and nanosystems: - Knowledge of the physical-chemical behaviour of part of the materials nanotechnologies. - Knowledge of the basic technologies for nanodevices fabrication. - Knowledge of models and methodologies used for the description and the design of nanosystems. - Knowledge of methods and CAD for nanosystems simulations and design. - Knowledge of methods for the integration of nanocircuits with microelectronic circuits. - Knowledge of techniques and issues related to the design, fabrication and verification of nanosystems. The student, after the course, should demonstrate the skills: - Ability to apply the gained knowledge in a research and/or industrial framework, understanding capability and skills in solving problems related to the design, modelling, simulation and implementation of nanosystems also applied to new technological principles or unfamiliar issues or entered into application contexts broader and more interdisciplinary than the engineering sector (medicine, environmental monitoring, food, ...); - Ability to design integration of nanosystems and its co-design with electronic circuits - Ability to apply technologies for the design of nanosystems. - Ability to integrate technical knowledge and to manage the complexity of the design, to evaluate the quality and robustness of a nanosystem, its implementation and feasibility, choosing the most efficient solutions from the available options; - Ability to communicate clearly and unambiguously technical aspects relating to the design and manufacture of integrated circuits at the nanoscale, both in writing and oral form and to both specialists and non-specialists; - Development of self-learning skills to allow the student to continue to learn autonomously new techniques and design methodologies for integrated nanosystems, not necessarily explained and described during the course.

The course aims to provide fundamental knowledge on the technologies and design for nanostructures and nanosystems, with particular emphasis on applications in the ICT area. This course plays a central role in the development of an Engineer expert in nanotechnologies because it extensively provides the basic elements for understanding how to study, understand and design a system based on emerging devices at the nanoscale either based on conventional or novel paradigms and how to connect them in more conventional microelectronics systems.

• Methods for modelling nanodevices and nanocircuits for the hierarchical design of micro and nanosystems. - Simulation, methods for integration and test of nanosystems. - Molecular devices: molecular wires, molecular diodes, molecular transistors, molecular sensors. - Silicon-based nanowires and nanosensors. - Field-coupled nanodevices for computation based on molecules, nanomagnets, and single atoms. - Magnetic devices and systems for memory and computation. - Carbon Nano Tubes used as interconnects and Field Effect Transistors: technology, models, circuits and applications - Quantum computing and communication: technologies, models and deployment to circuits

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria; Elaborato progettuale in gruppo;
Exam: Written test; Compulsory oral exam; Group project;
... The exam consists of three parts: - Written exam: The written exam will be on the more theoretical and design part and based on specific exercises on the various topics (30%). - Oral exam: The oral exam will be on the whole subject (30%). - Laboratory reports: The laboratories will require a report on each subject and will be evaluated for the final exam (40%). A final project is also available and it will be an extension of one of the laboratories with subjects proposed by the teacher to be elaborated and investigated (from 1 to 4 points to the final score). The project is not mandatory. Expected learning outcomes: Laboratory reports: - understanding the models of the analysed devices and the impact of parameters on the device behaviour - capability to use the simulation tools and the design tools and their optimization and relation to the device and circuit characteristics - skill in the design of small circuits based on the analyzed devices - capability in writing a correct, exhaustive, and clear technical report Written exam: - knowledge of the theoretical behaviour of the analysed devices and the systems - understanding of the impact of parameters and technology on the device behaviour - capability to apply the theoretical analysis to practical and numerical examples - knowledge of the technological processes impacting on the device electronics behaviour - capability to design small circuits based on the analyzed devices Oral exam: - knowledge of the characterised devices and circuits, technological and physical parameters, and analyzed fabrication processes - knowledge of the relations between theory and application for the analysed devices and circuits - capability to discuss the performance of devices and circuits Final Project: - skill in analyzing the behaviour of devices and/or circuits - capability to search and understand new aspects of the subjects analyzed during the course, eventually not covered during the lectures - autonomy in finding solutions to unexpected problems on devices and circuits, and with the adopted tools - creativity in the design and application of the device under analysis - capability to write a complete and extended technical report Exam rules - Laboratory reports: The reports are to be delivered within two weeks from the laboratory date, and are expected to be completed in terms of the answers to the asked questions and exercises. The report must be well presented and connected to the theory analyzed in the lectures; critical thinking will be especially evaluated. Lab reports are evaluated over a maximum score of 30 - Written exam: It consists of two/three open questions that might include also numerical exercise as a part to be completed and the time for the exam is two hours; no reading material or books are allowed; a maximum score of 30 is possible - Oral exam: the exam is based on three to five questions on the subjects covered in the course, and could also require applying and discussing the studied theory to practical new study cases. The oral consists of 15 minutes to prepare the answers to two questions and 30 minutes to present the answers and to discuss them at the board - Final Project: the project topic will be chosen from a list of possibilities, each related to one of the subjects analyzed in classes and labs; critical thinking is especially stimulated and in some cases could require learning and discovering new elements and tools; the project will be described with some progressive steps and the student can choose how many steps to take. The maximum evaluation is 30L and will be related to the number of steps, the degree of difficulty, the capability to apply the theory and to go in-depth with the analysis as well as the level of creativity and imagination involved. The project should be delivered by the end of the winter exam session. The project is not mandatory.

The material (slides, scientific papers, material for the lab execution, and lecture notes) will be available, and some books will be suggested for integration by the teacher. Books - Marc Baldo "Introduction to Nanoelectronics", - Supryio Datta "Lessons from Nanoelectronics" - Michael Petty "Molecular Electronics, from principle to practice", Whiley

• Knowledge of the kernel structure and organization of an operating system • Knowledge of virtual memory mechanism • Knowledge of process scheduling and parallel execution threads • Skill for using system calls for the creation, synchronization and termination of processes and threads • Skill to understand device drivers • Skill to understand and implement programs based on system calls • Skill for using embedded systems development tools: cross-compilers, emulators, debuggers, profilers, virtualizers.

The course focuses on the basics of the operating systems architecture, with a particular emphasis on operating systems for embedded systems, along with their corresponding development frameworks. The course will also cover issues related with real-time embedded systems and their communication with dedicated hardware components.

Operating system architecture (0.5 CFU) - Operating systems classification - Structure of an operating system in terms of resources and corresponding management modules. - The OS Kernel: possible organizations. - Process types Processes and Threads (2.1 CFU) - Processes: definition and types - Concurrent processes - Process management - Process scheduling - Process synchronization and synchronization primitives - Inter-Process Communication Memory management, virtualization (0.4 CFU) - Segmentation and Paging - Virtual memory Embedded Systems (1 CFU) - Introduction to Real Time systems - Development tool-chains for embedded systems - Challenges in device-drivers design

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria; Elaborato progettuale in gruppo;
Exam: Written test; Compulsory oral exam; Group project;
... The examination consists of a written test and an oral verification. The written test (duration of 120 minutes with closed books) consists of two parts: • 4 exercises/questions on the topics of the lectures (4 points each exercise) • the solution to a problem using threads or concurrent programming in C language (16 points). Students can access to the oral exam only if the evaluation of the written exam is higher than 17. The oral verification will be on the topics of the lectures and on the verification of the program developed at the written exam. For the verification of the program, the student will have to provide the debugged and running code. The oral exam contributes to the final grade modifying the evaluation of the written exam in a range of ±4 points. The verification will be organized as a discussion in front of a PC where the student will be asked to: – Compile/Build the software – Run the software – Explain a piece of code taken at random from the source files – Possibly explain how and where to modify the code to change one of the program functionalities – Discuss the results.

The slides used for the course will be made available to the students, through the official page of the course on the web site. The textbooks are the following: • Silberschatz, Galvin, Gagne, "Operating System Concepts", 9th Edition, John Wiley & Son, 2013 • Tanenbaum, Bos, "Modern Operating Systems", 4th Edition, Pearson, 2015

• Concept of embedded system. - Understanding of the development tools for embedded systems: cross-compiler, emulator, debug tools, profiling tools, virtualization tools. - Concept of real-time embedded systems. - Understanding of examples of operating systems for embedded systems. - Skill for the development of modules for the communication with ad-hoc hardware components.

The course is taught in English. This course is part of the Master Degree in Computer Engineering, focused on Embedded Systems, and it is eligible course for the Master Degree in Mechatronic Engineering. The course aims at deepening the concepts acquired during the Operating Systems course, describing the peculiarities of embedded systems, of the dedicated development tools, and outlining the peculiarities of some operating systems for embedded systems that are particularly relevant (process scheduler, OSEK/VDX, AUTOSAR, Linux). The course will also deepen the concepts of real-time embedded systems, and the issues of communications with ad-hoc hardware components.

Introduction to Embedded Systems (0.5 CFU) - Classification with respect to desktop systems. - Memory technology device. Development tools (0.5 CFU) - Cross-compiler. - Emulator. - Debugger. - Profiler. - Virtual platforms. Operating Systems for Embedded Systems (4 CFU) - Real time and process scheduling. - Analysis of the architecture and services offered by operating systems for embedded: process scheduler, VxWorks, OSEK/VDX, AUTOSAR, Linux. - Anatomy of an operating system for embedded systems. Programming of an embedded OSEK/VDX system (1 CFU): - I/O management, and device drivers. - Use of an evaluation board. - Building a OSEK/VDX operating system for embedded systems: how to use development tools. - Design and development of device drivers for custom devices.

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

Notes provided by the teacher. Additional reading: A. Berger Embedded Systems Design: An Introduction to Processes, Tools and Techniques CMP Books, 2001, ISBN-10: 1-57-820073-3 Silbershatz A., Galvin. P., Gagne G. Operating Systems 8th Edition, Wiley, 2009, ISBN: 978-0-470-12872-5

The student in this course will acquire: • A broad information on the optical properties of the main materials exploited in photonic devices: dielectrics, metals, semiconductors. To this aim, an extensive phenomenological treatment is provided on the Lorenz theory for the dielectric response, on the Drude theory of the metal response, and on the band-to-band interactions involved in the response of semiconductors (absorption, spontaneous emission, stimulated emission), including the qualitative behavior of quantum well structures and the related selection rules. An introductory reminder is also provided on the crystal and electronic properties of the relevant materials. • A detailed knowledge on the principles of operation of active photonic devices, including sources (LEDs, lasers), optical amplifiers (SOAs), electro-optic and electro-absorption modulators, receivers (pin and avalanche photodiodes). • A knowledge of the propagation properties of the main waveguiding structures (dielectric waveguides, plasmonic waveguides) and of the passive optical components (MMI components, coupled mode components). • A knowledge of the aspects related to the integration of optoelectronic devices (hybrid and monolithic). • The ability of evaluate the main properties of active and passive photonic devices through simplified analytical approaches • The ability of applying numerical techniques (e.g. the beam propagation method) to the analysis of complex propagating (active and passive) photonic structures.

The course is entirely taught in English. The goal of the course is the presentation of the major integrated photonic devices (semiconductor and passive ) together with their characteristics and methods and techniques used for their design and simulation .

• Introduction to the course. Materials for photonics: optical properties of metals, dielectrics, semiconductors (1 CFU) • Passive waveguiding structures: dielectric & plasmonic waveguides, MMI devices. Mode coupling, coupled mode components (1.5 CFU) • Detectors: pin, avalanche, structure of a photonic receiver (1 CFU)) • Modulators: electro-optic effect, electro-optic modulators, electro-absorption modulators (0.5 CFU) • The Beam Propagation Method and BPM lab (0.5 CFU) • LEDs, Semiconductor Optical Amplifiers and LASERs (1 CFU) • SOA/LASER numerical lab (0.5 CFU)

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria; Elaborato scritto prodotto in gruppo; Elaborato progettuale in gruppo;
Exam: Written test; Compulsory oral exam; Group essay; Group project;
... The examination in based on: 1. A written test on theory (2h), consisting in the written answer to a set of open questions; questions are taken verbatim from a set provided already from the beginning of the course in the web site. Questions are divided in groups (both in the set and in the examination) according to the main subjects of the course; typically, two questions per set are proposed; it is suggested to answer at least to a question per set. The theory test aims at assessing the knowledge of the subjects introduced in the course. During the written test, no written material is allowed. 2. One or more (typically two) CAD lab short reports where the student must apply the CAD tools introduced in the lab to a specific problem and discuss the results. 3. A homework, based on the solution of numerical problems (as discussed in the numerical classroom labs and as available in a solved problem set available from the course web site). The purpose of the homework is to test the students' ability to develop computations (often MATLAB or other computational tools are needed) on the basis of the theory. CAD labs and homeworks are group assignments (2-4 people), only exceptionally individual assignments are considered. Groups are typically organized in the second month of the course. 4. A short oral (20 m max) based on the discussion of the written part and if needed of the CAD reports / homeworks. The purpose of the oral is to test the student's ability to explain in a consistent way the subjects treated in the course; subject understanding in its general lines is more important than the knowledge of this or that formula. If some subject areas are missing in the written test the oral part will by trying to cover first those areas. The relative weight of items 1 and 4 is 4/6; the oral test can correct (+/-) the written score. The weight of item 2 and 3 is 1/6 each.

Lectures are covered by a set of powerpoint slides available from the course website. Part of the course subjects (optical properties of semiconductors, detectors, modulators) are covered in detail in: • G. Ghione, ‘Semiconductor devices for high-speed optoelectronics’, Cambridge 2009. Additional reference books are: • L.A.Coldren, S.W. Corzine 'Diode Lasers and Photonic integrated Circuits' Wiley 1995 (Chapters 3 - 6) • K.J. Ebeling, 'Integrated Opto-electronics', Springer-Verlag, 1993 (Chapters 5 and 6); • L.A. Coldren, S.W. Corzine 'Diode Lasers and Photonic integrated Circuits', Wiley 1995 (Chapters 3-6).

Physics of technological processes/Design of microsystems (Design of microsystems)- Use of CAD tools for MEMS modeling, analysis and optimisation; - MEMS design basics and methodologies; - Professional approach to the design of MEMS-based applications; - Development of knowledge over different physical domains, other then electrical one (as mechanical, thermal, magnetic, optic, fluidic, ...) and in particular the skill of connecting them together for implementing transduction systems (sensors and actuators for example), and then interfacing and integrating the different parts; - Ability to apply the knowledge gained in a research and/or industrial framework, understanding capability and skills in solving problems related to the design, simulation and implementation of microsystems also applied to new or unfamiliar issues or entered into application contexts broader and more interdisciplinary than the engineering sector (medicine, environmental monitoring, food, ...); - Ability to integrate technical knowledge and to manage the complexity of MEMS design, evaluating its quality and robustness, its implementation and feasibility, choosing the most efficient solutions from the available options; - Ability to communicate in a clear and unambiguous way technical aspects relating to the design of microsystems, both in writing and oral form and to both specialists and non-specialists; - Development of self-learning skills to allow the student to continue to learn autonomously new techniques and design methodologies for microsystems, not necessarily explained and described during the course. Physics of technological processes/Design of microsystems (Physics of technological process)Expected knowledge: • development of knowledge that extends and/or reinforces the ones received from preparatory courses and allow to develop and/or apply original ideas and design methods and the development of a technological process flow for the production of integrated circuits and microsystems; • ability to apply the knowledge gained in a research and/or industrial framework, understanding capability and skills in solving problems related to the design, simulation and implementation of microelectronic circuits and microsystems also applied to new or unfamiliar issues or entered into application contexts broader and more interdisciplinary than the engineering sector (medicine, environmental monitoring, food, ...); • ability to integrate technical knowledge and to manage the complexity of the design and manufacturing process flow, to evaluate the quality and robustness of a process flow, its implementation and feasibility, choosing the most efficient solutions from the available options; • ability to communicate in a clear and unambiguous way technical aspects relating to the design and manufacture of integrated circuits and microsystems, both in writing and oral form and to both specialists and non-specialists; • development of self-learning skills to allow the student to continue to learn autonomously new techniques and design methodologies and fabrication techniques for integrated circuits and microsystems, not necessarily explained and described during the course. Expected skills • Knowledge of the physical-chemical behaviour of materials to be used in micro and nanotechnologies. • Knowledge of the basic technologies for microstructure realization. • Knowledge of materials and technologies for Microsystems and MEMS realization. • Ability to apply materials and technologies for realization of microstructure and microsystems. • Knowledge of techniques and issues related to the fabrication and verification of nanosystems.

Physics of technological processes/Design of microsystems (Design of microsystems)This course aims to give to students an introduction to the Design of Microsystems. A particular focus is given to the use of CAD tools, for the simulation of micro and nanosystems, targeting the design of optimised devices. Starting from basic concepts about microsystems and their multi-physical modeling, the course develops both behavioral modeling and the Finite Element description of structural and functional parts (FEM, Finite Element Modeling) of a microsystem. For both modeling approaches the main CAD tools available are described and used (Matlab/Simulink for behavioral, Comsol for FEM modeling), extracting the relevant project parameters, first for analysis and optimisation, then for system synthesis and integration. An overview of examples of the main applications of micro and nanodevices is given, and a project methodology capable of operating on different domains is taught. Teaching is mainly addressed to students interested in the aspects of design and implementation of micro and nano-scale devices.Physics of technological processes/Design of microsystems (Physics of technological process)The course is taught in English. Aim of the course (1st semester, 1st year of the International LM in Nanotechnologies for ICT) is to provide the theoretical basics to be exploited in the study of materials, technologies and design for realization of microelectronic devices, micro and nanostructures, microsystems and MEMS/NEMS (micro/nano-electro-mechanical systems), with particular emphasis on applications in the ICT area. This course plays a central role in the development of an Engineer expert in micro an nanotechnologies, because it extensively provides the basic elements for the fabrication and design of the above mentioned devices and it is preparatory for the understanding of subsequent courses of the Laurea Magistrale. In the course the fundamentals of technologies and material for microelectronics and microsystems and some examples of the same are treated and discussed, thus making the course specifically addressed to those students interested in the fabrication and design aspects of micro and nano-scale devices.

Physics of technological processes/Design of microsystems (Design of microsystems)- Introduction to the modeling and the use of CAD for microsystems (1 ECTS); - Modeling and interaction between different physical domains (1 ECTS); - Finite Element Modeling, introduction to COMSOL (1 ECTS); - Guided Development in laboratory of some examples of microsystems (1 ECTS); - Self-Development and design of a microsystem, with related models and simulations (2 ECTS).Physics of technological processes/Design of microsystems (Physics of technological process)Integrated Circuits technologies (wafer preparation, cleanroom technology, silicon oxidation, epitaxy, CVD, evaporation, sputtering, electroplating, diffusion, ion implantation) (2 ECTS) Lithographic techniques, wet etching, dry etching, back-end technologies, CMOS process flow (2 ECTS) Introduction to MEMS and NEMS, bulk micromachining, surface micromachining, LIGA, wafer bonding, MEMS packaging, MEMS complementary technologies (2 ECTS)

Physics of technological processes/Design of microsystems (Design of microsystems)Modalita di esame: Prova scritta (in aula); Elaborato progettuale in gruppo; Physics of technological processes/Design of microsystems (Physics of technological process)Modalita di esame: Prova scritta (in aula);
Physics of technological processes/Design of microsystems (Design of microsystems)Exam: Written test; Group project; Physics of technological processes/Design of microsystems (Physics of technological process)Exam: Written test;
... Physics of technological processes/Design of microsystems (Design of microsystems)The assessment is organized with a mandatory written exam that gives a maximum mark of 30/30. The students (organized in groups of no more than 3 elements) can do a not mandatory project of a simple device, with simulations based on the tools learnt during the course, and produce a final written report. This work is evaluated and can give a maximum of 3 points, which are added to the written exam mark. If the final sum is larger than 30, the "cum laude" is assigned.Physics of technological processes/Design of microsystems (Physics of technological process)The exam involves a written proof including both multiple-answer questions and open questions and short exercises. The total allotted time is 60 mins. The type of proposed questions aims to test the student ability to understand and revision the topics covered in class lectures, with particular reference to the ability to compare similar technologies, compare results or processing parameters of technological processes or performance of different materials. The main evaluation criteria of the exam consist in the correctness of the tests solutions, the completeness and synthesis of the responses to the open questions and the correctness of the employed technical language.

Physics of technological processes/Design of microsystems (Design of microsystems)- Material (slides) provided by the Teacher ; - eLearning material based on two European projects: EduNano (http://edunano.eu). and NanoEl Asia (http://nanoel-asia.eu). Access credentials will be given during the course; - Stephen D. Senturia, "Microsystem Design", Kluwer Academic Publishers.Physics of technological processes/Design of microsystems (Physics of technological process)The didactic material (slides for the lectures) will be distributed by teachers. Suggested but not mandatory books will be specified by the teacher. Among them: - “Microsystem Technology�, W. Menz, J. Mohr, O.Paul, Wiley-VCH ed.

After this course, a student will have a detailed knowledge of the basic DC-DC power conversion topologies, in particular buck, boost, buck boost, their working modes. He or she will know some methods for deriving a linear small signal model of switching converters. Beside the non-isolated topologies, a student will learn the detailed behavior of the most common derived converters using an isolation transformers, including their small signal models. By the end of this course, a student will be able to design both the power and control section of an isolated converter, choosing the best among various different topologies and control methods, and estimating the component stress and total circuit efficiency.

This course provides the student with an in depth knowledge about the themes of systems and circuits used for powering electronic circuits and small electromechanical actuators. Students will study mainly DC-DC converters, analyzing energy efficiency, control, isolation and electromagnetic noise generation which shouldn’t inject disturbances in the mains. This class has a strong design flavor: most important methods of analysis and design both for power and control stages will be presented.

Basic DC/DC converters: Buck, Boost and Buck-Boost. Steady state (cyclostationary) characteristics in continuous and discontinuous conduction mode, design criteria and stress evaluations (1.8 CFU) Dynamic behavior. Averaged models, state space average, switch average, circuit average. Linearization. Power factor correctors (1.6 CFU) Design of closed loop control, both voltage mode and current mode (0.8 CFU) Derived configurations: Analysis and design of Buck-derived circuits (Forward, push-pull, half bridge, full bridge). Analysis and design of a flyback. Design of control section (1.8 CFU)

Modalita di esame: Prova scritta (in aula); Prova orale facoltativa;
Exam: Written test; Optional oral exam;
... Written test with a theory section (closed books, 30min) and a design problem section (open books 2hrs). A few days after the written part there is a 45 minutes oral exam. Each written section and the oral exam is about one third of the final grade. First written section tests the basic knowledge of the DC to DC converters. The second section tests the student design capability, requiring a full converter design according to given specifications. Design must include topology choice, power stage design, determination of its small signal model and compensator design. Oral part starts discussing the written test and evolves towards more specific and in depth subjects, mainly theoretical.

Instructor’s class notes or handouts both in Italian and in English. Extra material: Erickson – Maksimovic, Fundamentals of Power Electronics, Springer; 2nd edition (January 2001) Kassakian, Schlecht, Verghese, “Principles of Power Electronics�, Addison Wesley

• Knowledge of the most important building block present within RF and microwave Transceivers; - Knowledge of the monolithic and hybrid, active and passive, technologies for the realization of the radiofrequency part of a communication system; - Capability to analyze linear two ports in terms of power gain and stability, and to design the linear subsystems within the receiver of a RF and microwave communication system; - Capability to analyze the non linear blocks present in a RF and microwave communication system: power amplifiers, mixers, oscillators; - Usage of commercial CAD tools for the simulation and design of high frequency circuits both using linear and large signal strategies; - Capabilities to design up to the layout level a power amplifier for the receiver and transmitter chain of a RF and microwave communication system; - Knowledge of the most important figures of merit to evaluate the performances of a communication system, and to analyze and discuss their impact on the system level performances;

The course is taught in English. Radio frequency integrated circuits (2nd year LM, 1st term) is a required course in the curricula: RF design, Integrated Electronic and Optoelectronic Devices and Technologies, Wireless System design. It provides the basis of radiofrequency analog circuit design, with particular attention to telecom applications, for both linear and quasi-linear or nonlinear subsystems. The relevant CAD tools are also introduced and exploited.

Lectures: - Description of the most important functional blocks within a RF and microwaves communication system with focus on the RF part; Review on the enabling technologies and on the passive and active elements within the RF part of a communication system; (0,5 CFU) - Linear functional blocks: general characteristics and adopted models, maximum gain amplifiers, feedback amplifiers with, large band amplifiers, distributed amplifiers; (1 CFU) - Noise in electronic systems: low noise amplifiers; (0,5 CFU) - The non linear blocks: general characteristics and adopted models; (0,5 CFU) - Power amplifiers; class A, B, C, class D,E,F high efficiency amplifiers, issues on power amplifier linearization, advanced power amplifier schemes, e.g. the Doherty approach; (1 CFU) - Mixers, frequency multipliers and oscillators. (0,5 CFU) Cad labs: (2 CFU) - RF and microwave circuit small signal simulation using RF and microwave dedicated commercial CAD tools; - Non linear RF simulations using dedicated commercial CAD tools: mixer and power amplifier simulations. Laboratories and/or exercises

Modalita di esame: Prova scritta (in aula); Prova orale obbligatoria; Elaborato progettuale individuale;
Exam: Written test; Compulsory oral exam; Individual project;
... A collection of exercises and problems are at student's disposal. The final test includes a written test, together with the development of an individual project using MWOFFICE, and a presentation and discussion of the results obtained with the project.

The course material includes a full collection of slides shown during the lesson hours together with hints on the CAD labs development. The book from B. Razavi RF 'microelectronics' covers most part of the course. Power amplifiers can also be examined more closely in the book Elettronica delle Microonde authored by G. Ghione and M. Pirola, edited by Otto editore in 2002 and also available in electronic (pdf) format.

• Knowledge of the concepts of testing and dependability. - Knowledge of the main techniques used for testing a digital circuit. - Knowledge of the main techniques used for testing an embedded system. - Knowledge of the basic techniques used for hardening an electronic products with respect to possible faults. - Knowledge of the main techniques for estimating the reliability of an electronic system. - Capability of developing the test plan for a digital device or embedded system - Capability to use the main software tools for testing an embedded system: fault simulators, automatic test pattern generators, automatic scan chain inserters. - Knowledge of the concept of Built-In Self-Test (BIST) and Boundary Scan (BS). - Knowledge of the concept of Failure Mode and Effect Analysis (FMEA). - Capability of designing BIST hardware modules.

The usage of electronic systems in applications where failures may results in critical consequences (e.g., in space, aircrafts, automobiles, trains, biomedical equipment) requires ensuring that the probability of a failure does not overcome some maximum threshold. This can be achieved by identifying and removing defective products (test) and by making products resilient to faults (fault tolerance). The course introduces methods and techniques for the design of reliable electronic circuits and systems, with special emphasis on the test performed to identify products affected by hardware faults, and on the solutions to harden electronic products with respect to faults and to the techniques to estimate the probability that possible faults may force them to produce failures.

1. Introduction to test and dependability (1 credit) a. Dependability: definition, attributes b. Fault models (temporary and transient): stuck-at, bridge, open, delay, SEU, SET c. Test of ICs, boards and systems d. Defect level: definition and evaluation e. ATEs 2. Techniques and tools for generating test stimuli for combinational and sequential modules (1 credit) a. Fault simulation b. Automatic Test Pattern Generation 3. Techniques and tools for testing specific modules (1 credit) a. Memory test b. Processor test 4. Design for Testability techniques (1 credit) a. Scan b. BIST c. Boundary Scan d. System on Chip test (IEEE 1500 and 1687) 5. Board test (0.5 credit) a. Main steps in PCB test b. IEEE 1149.1 6. Basics in fault tolerant system design (1.5 credits) a. Basic fault tolerant design solutions (hw redundancy, information redundancy, time redundancy) b. Reliability evaluation (FMEA, radiation experiments, fault injection)

E' possibile sostenere l?esame in anticipo rispetto all?acquisizione della frequenza

Students may benefit of the following textbook: M. Bushnell, V. Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits Kluwer Academic Publisher, 2000 Slides will be provided to students registered to the course through the Student Teaching Portal, as well as any additional non-copyrighted information material that will be used in the course.